# US 4,399,401 A · Method for destructive testing of dielectric ceramic capacitors

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- Number: US 4,399,401 A
- Document ID: US4399401A
- Status: Granted
- Kind: A
- Application number: 06/296,452
- Filed: 1981-08-26
- Granted: 1983-08-16
- Earliest claimed: 1981-08-26
- Assignees: Centre Engineering, Inc.
- Inventors: Solomon Levinson; William Reilly
- Web page: https://patentgrep.com/patent/US4399401A

## CPC

- G01R 31/64: Testing of capacitors
- G01R 31/18: Subjecting similar articles in turn to test, e.g. go/no-go tests in mass production
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)

## Abstract

This invention covers a destructive testing procedure in which a voltage 2.5 times the rated voltage is applied to the capacitor, at a relatively high current. The resistance in series with capacitors being tested is reduced step-by-step until the resistance value is reached such that the percentage of capacitor failures on any given sample of capacitors remains constant. Thereafter, all similar capacitors are tested at that resistance value and at 2.5 times the rated voltage. Those which do not explode exhibit remarkable reliability.

## Claims

### Claim 1

A method of testing ceramic dielectric capacitors comprising the steps of
a. applying a voltage of 2.5 times the rated voltage of said capacitor to said capacitor through a variable resistance,
b. varying the value of said resistance from 0 ohms to a nominally low ohmic value,
c. testing a plurality of groups of similar capacitors at each resistance value and determining the failure rate at each of said resistance values,
d. setting a test resistance value equal to that at which the failure rate is substantially level, and
e. applying a voltage 2.5 times the rated voltage for each further capacitor being tested through a resistance having a value determined in accordance with step d.

### Claim 2 (depends on 1)

A test method as set forth in claim 1, further comprising the step of maintaining said voltage across each said capacitor for a predetermined minimum time period.

### Claim 3 (depends on 2)

A test method as set forth in claim 2, further comprising the step of applying said voltage repeatedly for a minimum time period of 5 seconds.

### Claim 4 (depends on 3)

A test method as set forth in claim 3, wherein said variable resistance is varied by 0.5 ohms at each test resistance value during step c.

### Claim 5 (depends on 1, 2)

A test method as set forth in claims 1 or 2, wherein said multilayer dielectric ceramic capacitor comprises an X7R type, said series resistance is equal to one ohm and said voltage is applied across each said capacitor being tested for a minimum of 5 seconds.

### Claim 6 (depends on 1)

A test method as set forth in claim 1, wherein the capacitor comprises piezoelectric material.