# US 4,396,640 A · Apparatus and method for substrate temperature control > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 4,396,640 A - Document ID: US4396640A - Status: Granted - Kind: A - Application number: 06/333,550 - Filed: 1981-12-22 - Granted: 1983-08-02 - Earliest claimed: 1981-12-22 - Assignees: Chevron Research Company - Inventors: Richard E. Rocheleau; Dennis F. Brestovansky; Peter J. Lutz - Web page: https://patentgrep.com/patent/US4396640A ## CPC - C23C 14/541: {Heating or cooling of the substrates} - C23C: COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL (making metal-coated products by extrusion B21C23/22; covering with metal by connecting pre-existing layers to articles, see the relevant places, e.g. B21D39/00, B23K; metallising of glass C03C; metallising mortars, concrete, artificial stone, ceramics or natural stone C04B41/00; enamelling of, or applying a vitreous layer to, metals C23D; treating metal surfaces or coating of metals by electrolysis or electrophoresis C25D; single-crystal film growth C30B; by metallising textiles D06M11/83; decorating textiles by locally metallising D06Q1/04) ## Abstract An apparatus and a method for controlling the temperature of a substrate onto which thin films of semiconductor materials are vapor deposited. The apparatus contains a platen contacting a surface of said substrate over the entire length of the deposition zone; said platen having at least one cavity therein and a rounded edge where said substrate first contacts said platen of the beginning of said deposition zone. ## Claims ### Claim 1 A method of heating and controlling the temperature of a substrate in a vacuum deposition chamber in the manufacture of thin films of semiconductor material, said method comprising: contacting a side of said substrate to a platen over the entire length of a deposition zone, said platen having means for transferring heat with said substrate; heating said platen to a temperature; measuring the temperature of said platen; maintaining the temperature in a cavity in said platen equal to the temperature of said platen so as to control the temperature of said substrate. ### Claim 2 (depends on 1) The method according to claim 1 wherein the temperature in the cavity is adjusted to equal the temperature of the platen by radiative heating the surface of said substrate opposite to the surface contacting said platen. ### Claim 3 (depends on 2) The method according to claim 2 wherein said measuring of the temperature is provided by a temperature sensor in said cavity, wherein said sensor is a thermocouple. ### Claim 4 (depends on 3) The method according to claim 3 wherein the thermocouple is in thermal communication with said substrate. ### Claim 5 (depends on 1) The method according to claim 1 wherein the surface of said platen contacting said substrate is sufficiently convex on the side contacting said substrate to prevent kinking of said substrate. ### Claim 6 (depends on 5) The method according to claim 5 wherein the surface of said platen contacting said substrate is coated with material to reduce the scratching of said substrate. ### Claim 7 (depends on 6) The method according to claim 6 wherein said platen is coated with hard chrome. ### Claim 8 (depends on 7) The method according to claim 7 wherein said substrate is copper foil. ### Claim 9 (depends on 8) The method according to claim 8 wherein the temperature of said substrate is adjusted such that a nonstoichiometric, cadmium-rich film of cadmium sulfide is deposited on said substrate. ### Claim 10 (depends on 1, 2, 4, 5, 7, 8) The method according to claim 1, 2, 4, 5, 7 or 8 wherein the substrate is moving. ### Claim 11 An apparatus for heating a substrate in a deposition chamber comprising: a platen contacting a surface of said substrate over the entire length of a deposition zone, said platen having at least one cavity therein and a rounded edge where said substrate first contacts said platen at the beginning of said deposition zone; means for heating said platen; means for sensing the temperature of said platen; means for sensing the temperature of said substrate within said cavity; means for maintaining the temperature within said cavity equal to the temperature of said platen; and means for contacting said substrate to said platen. ### Claim 12 (depends on 11) The apparatus according to claim 11 wherein the surface of said platen contacting said substrate is sufficiently convex on the side contacting said substrate to prevent kinking of said substrate. ### Claim 13 (depends on 12) The apparatus according to claim 12 wherein said means for sensing the temperature of said platen is a thermocouple in said platen and said means for sensing the temperature of said substrate is a thermocouple in said cavity, said heating means is at least one strip heater on the side of said platen opposite to the side of said platen in contact with said substrate, said thermocouple in said platen adjusts the temperature of said platen by controlling said strip heater(s). ### Claim 14 (depends on 13) The apparatus according to claim 13 further incorporating at least one radiative heater facing the side of said substrate opposite to the side contacting said platen, said radiative heater is controlled to adjust the substrate temperature through a differential temperature controller, said differential temperature controller is connected to said thermocouple in said platen and said thermocouple in said cavity. ### Claim 15 (depends on 14) The apparatus according to claim 14 wherein the temperature of said substrate is adjusted by the differential temperature controller adjusting the heat input to said substrate from said radiative heater. ### Claim 16 (depends on 15) The apparatus according to claim 15 wherein a plurality of radiative heaters are connected to said differential temperature controller. ### Claim 17 (depends on 16) The apparatus according to claim 16 wherein said apparatus incorporates a plurality of platens and differential temperature controllers. ### Claim 18 (depends on 17) The apparatus according to claim 17 wherein the temperature of said substrate is profiled over the deposition zone by adjusting the heating of the radiative heaters and the temperatures of the plurality of platens.