Collinear four-point probe head and mount for resistivity measurements

Abstract

An improved resistivity probe comprised of a rigid strip of electrically nonconducting material having a number of metallic, generally parallel pins coupled thereto. The strip can be mounted in a vertically shiftable probe head in any suitable manner. In one embodiment, the pins are rigidly secured by an epoxy to the strip. In another embodiment, the probe includes a pair of rigid strips having semi-cylindrical recesses on the inner faces thereof for receiving therebetween a number of resistivity measuring pins. The strips are held together by rivets or other fasteners. A multiple probe assembly can be made with a disk-like body having a number of angularly disposed slots therethrough for receiving a number of probes with each probe including a rigid strip having a number of pins coupled thereto. The probes extend into respective slots of the body so that the pins project downwardly from the lower face of the body to permit multiple resistivity measurements to be made without having to rotate the probes. An improved mount for a resistivity probe includes an arm mounted on an upright post for up and down movement, and a moving means which can be electrical, pneumatic, hydraulic or vacuum operated, can be used raising and lowering the arm. A single probe or a multiple probe assembly can be used on the outer end of the arm for making resistivity measurements.

Dependencies are inferred from the claim text.