Variable coupling resistance delay line for crossed field tube
AssigneeThomson-CSF
InventorsJean P. Morizot, Rene Gerber
Life of this patent
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Abstract
The thickness of the fingers of the line is modified, while the pitch of the fingers is kept constant, so that the capacitance between two successive fingers varies substantially proportionally to the product P.sub.HF .times.dI/dx, in which P.sub.HF represents the microwave power at any point x in the line and dI/dx the gradient, as a function of the position x on the line, of the current I delivered by the voltage supply creating a continuous electrical field E.sub.o between the electrodes of the tube. The values of P.sub.HF and of I are measured on the tube having a constant coupling resistance or are calculated by a computer program.
Claims8
A variable coupling resistance delay line for a crossed field tube, said tube having two parallel electrodes one a positive and the other a negative electrode and between which there is a continuous electrical field E.sub.o, the positive electrode being constituted by a delay line incorporating a sequence of fingers facing the negative electrode, the structure of the delay line ensuring the synchronism of the microwave travelling through it and of an electron beam moving between the negative electrode and the delay line and the pitch of the fingers and their distance from the negative electrode being constant, wherein there is between two successive fingers an interdigital which varies, by modifying the structure of the fingers, substantially porportionally to the product P.sub.HF .times.(dI/dx) in which P.sub.HF prepresents the microwave power at the point x on the line and in which dI/dx represents the current gradient delivered by the voltage supply creating the field E.sub.o as a function of the position x on the line, P.sub.HF and I being measured on the tube having a constant coupling resistance or calculated by a computer programme, the variation in the interdigital capacitance bringing about an inverse variation of the coupling resistance.
Dependencies are inferred from the claim text.