Radiation measuring apparatus

Apparatus for measuring a characteristic of a sample, the sample comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the radiation receiving and directing means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into separate beams;
• an optical system located in spaced relationship with said optical axis for receiving one of said beams;
• a sample holder in position to receive said one beam from said optical system;
• a detector for receiving said one beam from the sample holder and for detecting the intensity of the received beam;
• and
• means for moving the housing means in said substantially transverse direction to move said radiation receiving and directing means toward and away from said optical system and thereby to change the intensity of said one beam.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• housing means supporting the source of radiation and the radiation directing means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating radiation from said radiation receiving and directing means into separate beams, the dividing means directing the beams back toward said radiation receiving and directing means in directions parallel to said optical axis;
• an optical system located in spaced relationship with said optical axis for receiving one of said beams;
• a sample holder in position to receive said one beam from said optical system;
• a detector for receiving said one beam from the sample holder and for detecting the intensity of the received beam;
• and
• means for moving the housing means in said substantially transverse direction to move said source of radiation and said radiation receiving and directing means toward and away from said optical system and thereby to change the intensity of said one beam, the movement of the source of radiation and the radiation receiving and directing means away from said optical system decreasing the intensity of the radiation reaching said sample, and the movement of the source of radiation and the radiation receiving and directing means toward said optical system increasing the intensity of the radiation reaching said sample.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• filtering means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the source of radiation, the radiation receiving and directing means and the filtering means for movement in a direction substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into separate beams;
• an optical system located in spaced relationship with said optical axis for receiving one of said beams;
• a sample holder in position to receive said one beam from said optical system;
• a detector for receiving said one beam from the sample holder and for detecting the intensity of the received beam;
• and
• means for moving the housing means in said substantially transverse direction in order to move said housing means, said source of radiation, said radiation receiving and directing means and said selecting means toward and away from said optical system and thereby change the intensity of said one beam, the movement of the housing means away from said optical system decreasing the intensity of the radiation reaching said sample, and the movement of the housing means toward said optical system increasing the intensity of the radiation reaching said sample.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• housing means supporting the radiation receiving and directing means for movement in a direction substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating radiation from said radiation receiving and directing means into separate beams;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said beams;
• a sample holder in position to receive the beam from the first optical system;
• first and second detectors for respectively receiving the beam from the sample holder and the beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction to move said radiation receiving and directing means toward and away from said optical systems and thereby simultaneously to change the intensities of both of said beams.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• housing means supporting the radiation receiving and directing means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating radiation from said radiation receiving and directing means into sample and reference beams;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said sample and reference beams;
• a sample holder in position to receive the sample beam from the first optical system;
• first and second detectors for respectively receiving the sample beam from the sample holder and the reference beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction to move said radiation receiving and directing means toward and away from said optical systems and thereby simultaneously to change the intensities of both the sample beam and the reference beam.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the radiation receiving and directing means for movement in a direction substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into sample and reference beams;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said sample and reference beams;
• a sample holder in position to receive the sample beam from the first optical system;
• first and second detectors for respectively receiving the sample beam from the sample holder and the reference beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction to move said radiation receiving and directing means toward and away from said optical systems and thereby simultaneously to change the intensities of both the sample beam and the reference beam, the movement of the radiation receiving and directing means away from said first optical system decreasing the intensity of the radiation reaching said sample and increasing the intensity of the radiation reaching said second detector, and the movement of the radiation receiving and directing means away from second optical system increasing the intensity of the radiation reaching said sample and decreasing the intensity of the radiation reaching said second detector.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• filtering means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the source of radiation, the radiation receiving and directing means and the filtering means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into sample and reference beams;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said sample and reference beams;
• a sample holder in position to receive the sample beam from the first optical system;
• first and second detectors for respectively receiving the sample beam from the sample holder and the reference beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction to move said housing means, said source of radiation, said radiation receiving and directing means and said selecting means toward and away from said optical systems and thereby simultaneously to change the intensities of both the sample beam and the reference beam, the movement of the housing means away from said first optical system decreasing the intensity of the radiation reaching said sample and increasing the intensity of the radiation reaching said second detector, and the movement of the housing means away from said second optical system increasing the intensity of the radiation reaching said sample and decreasing the intensity of the radiation reaching said second detector.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• filtering means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the source of radiation, the radiation directing means and the filtering means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into sample and reference beams, the dividing means directing the sample and reference beams back toward said radiation receiving and directing means in directions parallel to said optical axis;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said sample and reference beams;
• a sample holder in position to receive the sample beam from the first optical system;
• first and second detectors for respectively receiving the sample beam from the sample holder and the reference beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction to move said housing means, said source of radiation, said radiation receiving and directing means and said selecting means toward and away from said optical systems and thereby simultaneously change the intensities of both the sample beam and the reference beam, the movement of the housing means away from said first optical system decreasing the intensity of the radiation reaching said sample and increasing the intensity of the radiation reaching said second detector, and the movement of the housing means away from said second optical system increasing the intensity of the radiation reaching said sample and decreasing the intensity of the radiation reaching said second detector.

Apparatus for measuring a characteristic of a sample, the apparatus comprising, in combination:

• a source of radiation;
• means for receiving radiation from said source and directing the same along an optical axis;
• filtering means located along said optical axis for permitting radiation having only selected wavelengths to proceed along said axis;
• housing means supporting the source of radiation, the radiation receiving and directing means and the filtering means for movement in a direction at least substantially transverse to said optical axis;
• radiation dividing means disposed in a stationary position along said optical axis for separating the selected portion of the radiation into substantially monochromatic sample and reference beams, the dividing means directing the sample and reference beams back toward said directing means in directions parallel to said optical axis;
• first and second optical systems located on opposite sides of said optical axis for respectively receiving said sample and reference beams;
• a sample holder in position to receive the sample beam from the first optical system, the sample holder including a sample conduit for receiving successive samples to be analyzed and a bleed conduit communicating with the sample conduit;
• first and second detectors for respectively receiving the sample beam from the sample holder and the reference beam from the second optical system and for detecting the intensities of the received beams;
• and
• means for moving the housing means in said substantially transverse direction in order to move said housing means, said source of radiation, said radiation receiving and directing means and said selecting means toward and away from said optical systems and thereby simultaneously to change the intensities of both the sample beam and the reference beam, the movement of the housing means away from said first optical system decreasing the intensity of the radiation reaching said sample and increasing the intensity of the radiation reaching said second detector, and the movement of the housing means away from said second optical system increasing the intensity of the radiation reaching said sample and decreasing the intensity of the radiation reaching said second detector.