Deflection measuring system
AssigneeHambro International (Structures) Limited
InventorEdward L. Ratcliffe
Life of this patent
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Abstract
A system for sensing the deviation of a surface, structure or the like from a reference axis is disclosed. A tilt sensitive transducer is used and this has two impedances the values of which vary differentially according to the angle and direction of tilt of the surface or member to which the transducer is mounted. Two equal but antiphase A.C. voltages are applied, respectively, to the two impedances and the current derived in each impedance is used to generate a D.C. voltage. The two D.C. voltages are compared to derive a difference D.C. voltage the magnitude and sign of which are dependent on the angle and direction, respectively, of tilt.
Claims7
A system for sensing deviation of a surface, structure or the like from a reference axis comprising a tilt sensitive transducer including a first and a second impedance the values of which vary differentially according to the angle and direction of tilt, means for applying an A.C. voltage across the first impedance, means for applying an antiphase A.C. voltage across the second impedance, rectifier means for deriving a positive D.C. voltage having a magnitude depending on the magnitude of the first impedance and deriving a negative D.C. voltage having a magnitude depending on the magnitude of the second impedance, means for adding the positive D.C. voltage and the negative D.C. voltage to derive a D.C. voltage the magnitude of which is dependent on the angle of tilt and the sign of which is dependent on the direction of tilt.
Dependencies are inferred from the claim text.