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US 4,378,489 AGranted
Miniature thin film infrared calibration source
AssigneeHoneywell Inc.
InventorsDouglas J. Chabinsky, Roger C. Coda
Life of this patent
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Abstract
An evaporated thin-film platinum resistance thermometer interleaved with a nichrome heating element on a sapphire substrate so as to calibrate infrared detectors and allow accurate control of the output signals of such detectors.
Claims11
In an infrared system having one or more infrared detectors, a device for calibrating said detectors prior to use of said detectors for data collection, said device comprising:
- A. a first substrate;
- B. a second substrate having good heat conduction properties;
- C. means for bonding a thin layer of said second substrate to said first substrate;
- D. a heating element having a substantially constant electrical resistance property over the desired operating temperature range of said device;
- E. a temperature sensing element having a high change in electrical resistance over the operating temperature range of said device;
- F. means for applying said heating element and said temperature sensing element to a common area of said thin layer of said second substrate on a side of said thin layer opposite said first substrate;
- and
- G. means for providing thermal isolation between said common area of said thin layer of said second substrate and said first substrate.
5 more elements
Dependencies are inferred from the claim text.