Procedure for measuring coating rates
AssigneeEnso-Gutzeit Osakeytio
InventorsHeikki Venalainen, Rauno Rantanen, Rertti Puumalainen
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AssigneeEnso-Gutzeit Osakeytio
InventorsHeikki Venalainen, Rauno Rantanen, Rertti Puumalainen
Estimating the term…
The invention concerns a procedure for measurement of the material quantities in coating layers applied upon a base material, by utilizing x-ray radiation. The procedure is particularly suited for use in a paper or cardboard manufacturing process wherein onto a material web in continuous motion are applied by steps one or several coating courses. The radiation source and detector are both placed on one side of the moving web, and the procedure is based on measurement of the fluorescence radiation excited by the primary x-ray radiation obtained from the radiation source in the material underlying the coating layer that is to be measured. The primary and secondary radiation both are thereby compelled to pass through the coating layer under measurement before the arrival of the fluorescence radiation at the detector. The moving web may be equipped with a plurality of consecutive pairs of radiation source and detector, the first pair measuring the fluorescence radiation from the base material before application of the coating layer and the latter measuring the equivalent fluorescence radiation after applying the coating layer, in above-presented manner. It is alternatively possible to use one single radiation source and detector and to measure simultaneously the fluorescence radiation produced both in the coating layer under measurement and in the underlying base material.
An improvement in a method of determining the quantities of material in a first coating layer applied to cardboard or equivalent base material as well as in a second coating layer applied to said first coating layer, said method comprising the steps of subjecting said first coating layer to a primary X-ray radiation derived from an outside source and travelled via said second coating layer, so as to excite a characteristic fluorescence radiation in said first coating layer, and measuring the intensity of said fluorescence radiation by means of a detector placed above said second coating layer, whereby the determination is based on the absorption of the primary X-ray radiation and the fluorescence radiation while travelling through said second coating layer, the improvement comprising that, in addition to exciting the fluorescence radiation of the first coating layer, the primary X-ray radiation is used to excite a characteristic fluorescence radiation in the second coating layer, which is measured by means of a detector and used as the basis for determination of the quantity of material in the second coating layer, while the measurement of the fluorescence radiation of the first coating layer is performed for the determination of the quantity of material in the first coating layer, with the aid of the quantity of material in the second coating layer as determined.
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