Methods of simultaneous contact and metal lithography patterning
AssigneeInternational Business Machines Corporation
InventorsKaren M. Abrahamovich, Clifford J. Hamel, Edward H. Payne, Dean R. Weed
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AssigneeInternational Business Machines Corporation
InventorsKaren M. Abrahamovich, Clifford J. Hamel, Edward H. Payne, Dean R. Weed
Estimating the term…
This describes different methods of using a single photoresist layer to define both metal contact vias and metal lift-off areas on semiconductor integrated circuits. The methods use positive photoresist containing a small amount of base such as imidazole to provide a lift-off overhang when the resist is exposed and developed to provide a reversal image. One method includes the steps of exposing selected regions of a layer of photoresist deposited on the surface of an integrated circuit, developing said image to remove the exposed photoresist to form a positive image, etching, exposing other selected regions of said photoresist layer to a negative image, baking the layer of photoresist to decarboxylate and fix the negative image in said layer of photoresist rendering all remaining unexposed regions of the said layer of photoresist, alkali soluble removing the alkali soluble regions of said photoresist, depositing metallurgy over the surface of the circuit and then removing the negative image formed in the layer of photoresist. A different method uses similar steps but in a different order. This second method first exposes and fixes the negative image which is not developed. The positive image is then exposed and developed to leave either unexposed resist or negative image exposed resist regions. The previously unexposed resist is rendered soluble in alkali developer and removed. Metal deposition and lift-off steps complete the method.
A photolithographic method of processing a photoresist in which both positive and reversal image processes are sequentially carried out in a single layer of positive photoresist containing a basic material, each of said image processes comprising an exposure step and a development step performed in said single layer of positive photoresist.
A photolithographic process in which a first latent image is exposed and fixed in a layer of positive photoresist containing a basic material, a second image is exposed, developed and used to form a relief pattern in a layer of material on a substrate, the first image is developed to form a second relief image and is used to define a different pattern in a layer on the substrate.
A lithographic method in which both positive and reversal image processes are sequentially carried out in a single layer of photoresist comprising the steps of:
A photolithographic method of processing a semiconductor in which both positive and reversal image processes are sequentially carried out in a single layer of positive photoresist containing a basic material comprising the steps of:
A lithographic method in which both positive and reversal image processes are sequentially carried out in a single layer of positive photoresist containing a basic material comprising the steps of:
A photolithograhic method of processing a photoresist in which both positive and reversal image processes are sequentially carried out in a single layer of positive photoresist containing a basic material comprising the steps of:
Dependencies are inferred from the claim text.