Method for penetrant inspection employing an etchant penetrant
AssigneeRockwell International Corporation
InventorOrlando G. Molina
Life of this patent
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Abstract
A method for detecting cracks and surface discontinuities in an object which comprises applying to the surface of an object having a ground surface and smeared metal, an etchant penetrant solution capable of removing said smeared metal covering the openings of said cracks, cleaning said surface to remove said excess penetrant solution, and applying to said surface a developer coating containing a fluorescent material, the etchant remaining in the cracks being capable of destroying the fluorescence adjacent the cracks, and viewing the surface under ultraviolet light to reveal indications of cracks showing intensely black against a fluorescent background.
Claims15
A method for detecting cracks and surface discontinuities in an object which comprises applying to the surface of an object having a ground surface and smeared metal, an etchant penetrant solution capable of removing said smeared metal from adjacent the openings of said cracks, cleaning said surface to remove the excess etchant penetrant, and applying to said surface a developer coating containing a fluorescent material, the etchant remaining in the cracks being capable of destroying the fluorescence adjacent the cracks, and viewing the surface under ultraviolet light to reveal black crack indications against a fluorescent background.
A method for detecting cracks and surface discontinuities in an object which comprises applying to the surface of an object an etchant penetrant solution, cleaning said surface to remove excess penetrant, and applying to said surface a developer coating containing a fluorescent material, the etchant remaining in the cracks being capable of destroying the fluorescence adjacent to the cracks, and viewing the surface under ultraviolet light to reveal black crack indications against a fluorescent background.
Dependencies are inferred from the claim text.