Temperature pattern measuring device
AssigneeSumitomo Kinzoku Kogyo Kabushiki Gaisha
InventorsMasao Tatsuwaki, Shin Nemoto, Yutaka Katayama, Michio Okada, Kazuyuki Hotta
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AssigneeSumitomo Kinzoku Kogyo Kabushiki Gaisha
InventorsMasao Tatsuwaki, Shin Nemoto, Yutaka Katayama, Michio Okada, Kazuyuki Hotta
Estimating the term…
A temperature pattern measuring device for obtaining the surface temperature distribution of an object. The device receives an image of the measured object and two different wavelength components of light emitted from the object. The device performs a two color temperature process for each minute area within a visual field of the image pickup, detecting the temperature at a portion on the surface of the corresponding measured object, thereby obtaining the temperature pattern thereof. The above minute areas can be set by an electrical method using photoelectric conversion means. Also, a supervision unit for the weld zone at an electrically seamed pipe, may employ the temperature pattern measuring unit of the present invention, the supervision unit producing a composite display of the form of the weld zone and the temperature pattern thereof.
A temperature pattern measuring device for obtaining the surface temperature distribution of an object to be measured, comprising:
A temperature pattern measuring device for obtaining the surface temperature distribution of an object to be measured, comprising:
A temperature pattern measuring device comprising:
A temperature pattern measuring device comprising:
A temperature pattern measuring device comprising:
A temperature pattern measuring device comprising:
A temperature pattern measuring device comprising:
Dependencies are inferred from the claim text.