Coplanar waveguide mounting structure and test fixture for microwave integrated circuits

Abstract

A versatile test structure for coplanar waveguide (CPW) microwave integrated circuits is provided with a support structure or carrier which accommodates any length of CPW circuit. The carrier is provided with a shock mounting means for a CPW substrate which protects the substrate against physical damage, as well as damage caused by widely varying thermal coefficients of expansion. The carrier is provided at each end thereof with a sliding connector to inject or remove microwave energy from the CPW substrate via a coaxial connector. The sliding connector and the carrier together comprise a mounting structure for the substrate which may be further provided with a sliding energy sampler or a right-angle CPW transition which may be used to sample energy levels within the substrate, or test individual portions of a CPW circuit.

Dependencies are inferred from the claim text.