US 4,364,179 A · Statically balanced inspection probe assembly

Abstract

A probe assembly for use with a three axis inspection machine that is intended to measure deviation of work piece surfaces in three axes includes apparatus for statically balancing the probe in the X and Y axes and also for restricting motion of the probe to a single axis or to any combination of the axes. The probe assembly includes a universal joint arrangement on the distal end of the measuring arm of the machine permitting deflection in the X and Y axes and also includes means for permitting travel in the Z axis. The various components are interconnected so as to make it possible to selectively preclude movement in either the X, Y or Z axis or to permit movement in one, two or all three axes, as desired. Furthermore, easy release friction means are employed to permit the probe stylus holder to slide along its longitudinal axis to prevent inadvertent damage to the actual probe assembly itself. The assembly is also designed to measure deviation of the probe, either by a printout or on an analog meter.

Claims15

Dependent claims

A probe assembly for measuring deviation in X, Y and Z axes, comprising:

(A) a housing;
(B) an elongate guide received within said housing;
(C) probe means carried by said guide and projecting from said housing;
(D) universal joint means interconnecting said probe means to said housing for permitting movement in the X and Y axes;
(E) means carried by said probe means for statically balancing said probe means in the X and Y axes;
(F) adjustable counterbalance means carried by said guide;
and
(G) measurement means
(1) carried by said housing and
(2) in contact with said probe means for measuring movement thereof in the X, Y and Z axes.

7 more elements

Dependencies are inferred from the claim text.

Statically balanced inspection probe assembly

Life of this patent

Statically balanced inspection probe assembly

Life of this patent

Abstract

Claims15