FMR Probe method utilizing main and spurious resonance modes for detecting surface flaws
AssigneeThe Board of Trustees of the Leland Stanford Junior University
InventorBertram A. Auld
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Abstract
In ferromagnetic resonance (FMR) probe apparatus for detecting surface flaws in a metal surface, probe impedance changes resulting from flaws are distinguished from impedance changes resulting from probe lift-off from the metal surface. A constant magnitude dc magnetic field and a constant frequency and constant magnitude rf magnetic field are applied to the ferromagnetic crystal and the real and imaginary components of probe impedance are detected. The impedance changes due to flaws are at least partially orthogonal to the impedance changes due to lift-out, and by observing probe impedance on an oscilloscope the presence of a flow or the occurrence of lift-off are readily identified.
Claims3
The method of detecting and distinguishing flaws in a metal surface detected by means of a ferromagnetic resonance probe from signals generated due to probe lift-off from the metal surface comprising the steps of:
- placing a ferromagnetic resonator adjacent to the surface, said resonator having a plurality of resonance modes,
- applying a dc magnetic field to said resonator,
- applying an rf magnetic field to said resonator,
- field coupling said probe and said surface with a main resonance mode and simultaneously at least one spurious mode of resonance,
- scanning said probe across said surface during said field coupling, and
- detecting during said scanning real and imaginary changes in impedance of said probe at a fixed frequency whereby probe impedance variation due to a flaw is generally orthogonal to probe impedance variation due to probe lift-off from said surface.
Dependencies are inferred from the claim text.