Measuring devices for X-ray fluorescence analysis
AssigneeGesellschaft fur Kernenergieverwertung in Schiffbau und Schiffahrt mbH
InventorsRainer Marten, Herbert Rosomm, Heinrich Schwenke
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AssigneeGesellschaft fur Kernenergieverwertung in Schiffbau und Schiffahrt mbH
InventorsRainer Marten, Herbert Rosomm, Heinrich Schwenke
Estimating the term…
A measuring device for X-ray fluorescence analysis, in which a specimen dosed on a carrier is stimulated by glancing incident radiation and examined spectrometrically by a detector which may be arranged above the specimen. On the upper side of an e.g., box-shaped housing in which a vacuum can be created, there is provided a detector extending into the interior of the housing. This detector is connected to the housing by means of a pivotable frame within the housing. The pivot axis of the frame is located in the measuring plane of the detector. Provided on the pivotable frame is a remote controllable specimen exchanger and a remote controllable disengaging device for shifting the specimen carrier out of its operative position, the disengaging device being substantially aligned with the detector axis. The pivotable frame has furthermore provided thereon counter bearings for the specimen carriers; these counter bearings surround the measuring region. In one side wall of the housing there is provided a ray inlet window which is aligned with the measuring plane. This window is for a radiation source which can be placed externally in front of the housing.
An apparatus including carrier plates for fluorescence analysis of specimens comprising in combination:
An apparatus including carrier plates for fluorescence analysis of specimens comprising in combination:
An apparatus including carrier plates for fluorescence analysis of specimens comprising in combination:
The method of fluorescence analysis of a specimen on a totally reflecting plane surface using X-ray radiation striking said specimen at a glancing angle to said plane surface to cause total reflection, and detecting radiation from the specimen on said totally reflecting surface by a detector having a detector axis passing through said specimen, said method in combination comprising:
The method of fluorescence analysis of a plurality of specimens on totally reflecting plane surfaces of specimen carrier plates with X-ray radiation irradiating and striking each specimen at a glancing angle to said plane surface to produce total reflection from the surface, and detecting radiation from the specimen by a detector having a detector axis passing through the specimen, said method in combination comprising directing X-ray radiation on a radiation axis intersecting the axis of said detector to form a measuring region at said intersection, moving said specimen carrier plates having totally reflecting plane surfaces in a plane perpendicular to said detector axis successively into a position traversed by said detector axis, adjusting abutment means defining a plane in said measuring region and pivotal about an axis in said plane and perpendicular to said detector axis and said radiation axis, said abutment means being angularly adjustable relative to said radiation axis, moving each carrier plate traversed by said detector axis into contact with said abutment means with its plane surface coincident with the plane defined by said abutment means, so that each specimen carrier plate may be positioned with its totally reflecting plane surface in the plane defined by said abutment means at a small angle to said radiation axis with the specimen irradiated on said plane surface under direct X-ray radiation and radiation reflected by said totally reflecting surface.
Dependencies are inferred from the claim text.