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US 4,357,574 AGranted
Loading apparatus for testing a power supply
AssigneeTakamisawa Cybernetics Co., Ltd.
InventorsKaihei Takamisawa, Masatoshi Yui
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AssigneeTakamisawa Cybernetics Co., Ltd.
InventorsKaihei Takamisawa, Masatoshi Yui
Estimating the term…
Loading apparatus for testing a power supply comprises an electronic load circuit, the electronic load circuit comprising an organically and systematically connected mode switching circuit capable switching from and to one another a constant resistance mode, a constant current mode and a slave mode. A load switching circuit is connected to the mode switching circuit and an error amplifier is adapted to input a voltage signal in each of the modes. A field effect transistor circuit is adapted to receive the output of the error amplifier as a gate control signal and has a drain terminal to which is fed the output from a power unit under test and further has a source terminal, the output of which is fed back as a comparison voltage signal to the error amplifier. A current measurement display circuit is branched to the source terminal of the field effect transistor circuit, and an overpower protection warning circuit is also branched to the source terminal. A voltage measurement display circuit is connected to the drain terminal, and a switching time setting circuit is provided for setting an automatic switching time in the load switching circuit.
A loading apparatus for testing a power supply under both dynamic and static conditions and wherein an artificially created dummy load simulates said power supply, comprising mode selection switching circuit means connected to select a constant resistance mode, a constant current mode and a slave mode;
The loading apparatus for testing a power supply as defined in caim 1, in which as overheat protection warning circuit means is connected between said error amplifier means and said field effect transistor circuit means.
A loading apparatus for testing a power supply under dynamic and static conditions, comprising field effect transistor circuit means having gate, drain and source terminals, means coupling the power supply under test between the drain and source terminals, means deriving a comparison signal from said source terminal, an error amplifier, input signal producing means, means applying the output of said input signal producing means and said comparison signal to said error amplifier means, means coupling the output of said error amplifier means to said gate terminal, current display means coupled to said source terminal of said field effect transistor circuit means, over power protection warning circuit means coupled to said source terminal means, voltage display circuit means coupled to said drain terminal means, and a loading time setting circuit means connected to control the application of the output of said input signal producing means to said error amplifier, said input signal producing means comprising means producing a first voltage proportional to the voltage at said drain terminal, means producing a second reference voltage, means producing a third voltage proportional to an external reference signal, and selection switch means coupled to selectively apply said first, second and third voltages to said error amplifier.
Dependencies are inferred from the claim text.