US 4,355,904 A · Optical inspection device for measuring depthwise variations from a focal plane

Abstract

A scanning laser measurement system for measuring depthwise variations of surfaces relative to a focal plane of an optical system. Laser light is directed to a test surface, generally aligned with the focal plane, through focusing optics having an optical axis. Some of the light from a beam spot is retro scattered from the test surface and reimaged along a path generally parallel to the optical axis. Depthwise variations in the test surface with respect to the focal plane cause spatial displacements in the retrobeam relative to the optical axis. The retrobeam is directed to a filter which is partially reflective and partially transmissive. A pair of photodetectors is used to intercept reflected and transmitted components of the retrobeam and the intensity of these components is measured and used to compute centroid values for the retrobeam on the filter for various beam spots on the test surface. The computed centroid values are directly proportional to depthwise surface deviations from the focal plane. The beam is directed to various points on the test surface by an optical scanner. If the deviations in the test surface from the focal plane are so great that a retrobeam cannot be formed, the entire optical system is translated until beam focus can be achieved and a retrobeam formed. The extent of translation is a coarse measurement of depthwise variations in the test surface relative to the focal plane, while the previously mentioned centroid values yield a fine measurement of depthwise variations relative to the focal plane.

Claims10

Dependent claims

An optical method for measuring fine depth variations of a test surface relative to a focal plane comprising,

(a) passing a forwardly directed, collimated light beam through a beam focusing lens having an optical axis and a focal plane generally coinciding with a test surface having depthwise variations to be measured, said light beam aimed at said test surface in a direction parallel to and displaced from the optical axis of the lens so that said collimated beam is focused to a spot on the test surface coinciding with the point of intersection of the optical axis of said lens with said focal plane,
(b) re-imaging retro scattered light from said test surface passing back along a path generally parallel to the optical axis and through the lens and through a partially reflective and transmissive filter having spatially variable reflectivity and transmissivity, said filter disposed transverse to the optical axis,
(c) measuring light intensity transmitted through and reflected from said filter and producing corresponding first and second electrical signals proportional to the measurements,
(d) computing a centroid value for the retro beam using said first and second electrical signals, and
(e) relating the computed centroid value to a depthwise deviation of the beam from said focal plane.

2 more elements

Optical apparatus for measuring depthwise variations of a test surface relative to a focal plane comprising,

a first lens having an optical axis and a focal plane generally coinciding with a test surface, said test surface having depthwise variations to be measured,
a source of collimated light positioned to direct a collimated beam through said first lens in a direction parallel to and displaced from the optical axis of said first lens so that said collimated beam is focused to a spot on the test surface coinciding with the point of intersection of the optical axis of said lens with said focal plane,
a partially reflective and transmissive filter having a spatially variable pattern of reflectivity and transmissivity disposed transverse to the optical axis rearward of said lens,
a second lens disposed along the optical axis for intercepting retro scattered light from said test surface and focusing said retro scattered light on said filter,
a first light detector means positioned to intercept light transmitted through said filter for producing a first electrical signal responsive to the intensity of light transmitted through said filter,
a second light detector means positioned to intercept light reflected from said filter for producing a second electrical signal responsive to the intensity of light reflected from said filter,
circuit means connected to said first and second light detector means for computing a beam filter centroid value from said first and second electrical signals and for relating said centroid value to a depthwise deviation of the beam from said focal plane.

4 more elements

Optical scanning apparatus for measuring depthwise variations of a test surface relative to a focal plane comprising,

a first lens having an optical axis and a focal plane coinciding with a test surface, said test surface having depthwise variations to be measured,
a source of collimated light positioned to direct a collimated beam through said first lens in a direction parallel to and displaced from the optical axis of said first lens so that said collimated beam is focused to a spot on the test surface coinciding with the point of intersection of the optical axis of said lens with said focal plane,
an optical beam scanning means aligned along said optical axis between said light source and said test surface for steering said beam along a selected locus of spots on the test surface,
a partially reflective and transmissive filter having a spatially variable pattern of reflectivity and transmissivity disposed transverse to the optical axis rearward of said lens and beam scanning means,
a second lens disposed along the optical axis for intercepting retro scattered light from said test surface and focusing said retro scattered light on said filter,
a first light detector means positioned to intercept light transmitted through said filter for producing a first electrical signal responsive to the intensity of light transmitted through said filter,
a second light detector means positioned to intercept light reflected from said filter for producing a second electrical signal responsive to the intensity of light reflected from said filter,
circuit means connected to said first and second light detector means for computing a beam filter centroid value from said first and second electrical signals and for relating said centroid value to a depthwise deviation of the beam from said focal plane, and
control means for enabling said beam scanning means to steer said beam to a new measurement point.

6 more elements

Dependencies are inferred from the claim text.

Optical inspection device for measuring depthwise variations from a focal plane

Life of this patent

Optical inspection device for measuring depthwise variations from a focal plane

Life of this patent

Abstract

Claims10