Micrometer
AssigneeMitutoyo Mfg. Co., Ltd.
InventorsIchiro Mizuno, Masao Nakahara
Life of this patent
Estimating the term…
Abstract
A micrometer comprising a letter `U` shaped frame, an anvil fixed on one end of said frame and directed to the other end thereof and a spindle supported on said frame in a manner to be axially movable from the other end at one end and, during measuring, the forward end thereof comes into abutting contact with an article being measured, a control knob connected to said spindle and projected outwardly from the frame, a rack formed on the spindle in the axial direction thereof and dial indicator driven by the spindle, when the spindle axially moves, through pinions being meshed with the rack, the spindle being moved by reciprocating operation of the control knob, which is operated by one hand gripping the micrometer, and a value of movement of the spindle being read by means of the dial indicator.
Claims6
A micrometer comprising a letter `U` shaped frame, an anvil fixed on one end of said frame and directed to the other end thereof and a spindle supported on said frame in a manner to be axially movable from the other end to one end and, during measuring, the forward end thereof comes into abutting contact with an article being measured, characterized in that said micrometer further comprises;
- a body integral with the frame;
- an arm connected to said spindle and projected outwardly from the body;
- a rack formed on said spindle in the axial direction thereof;
- a dial indicator driven by the spindle through pinions being meshed with said rack when the spindle moves in the axial direction thereof;
- and a control knob tiltably connected to the outer end of said arm and biased in one direction of tilting by means of a spring, whereby said control knob is pressed at one end thereof against the body side in the normal condition and, when said control knob is pressed at the other end against a biasing force of the spring, said control knob is brought out of contact from the body side.
Dependencies are inferred from the claim text.