High-voltage circuit for insulated gate field-effect transistor
AssigneeHitachi, Ltd.
InventorsIsao Yoshida, Minoru Nagata, Shikayuki Ochi, Hisao Katto
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AssigneeHitachi, Ltd.
InventorsIsao Yoshida, Minoru Nagata, Shikayuki Ochi, Hisao Katto
Estimating the term…
A high-voltage circuit for insulated gate field-effect transistors (MOSFETs) is provided wherein two MOSFETs are connected in series, the source and gate of the first MOSFET being respectively used as a source terminal and gate terminal of the high-voltage circuit, the drain of the second MOSFET being used as a drain terminal of the circuit. First and second resistors are connected in series between the source terminal and the drain terminal, and a biasing voltage supply is connected between the juncture of both the resistors and the gate of the second MOSFET. By virtue of these connections the "on" resistance of the high-voltage circuit is improved due to the effect of the biasing voltage effect in bringing the second MOSFET into an "on" condition.
A high-voltage MOSFET (insulated gate field-effect transistor) circuit wherein n MOSFETs are connected in series by electrically connecting a drain of the m-th (1.ltoreq.m.ltoreq.n-1) MOSFET and a source of the (m+1)-th MOSFET, a source and gate of the first MOSFET being respectively used as a source terminal and gate terminal of the MOSFET circuit, a drain of the n-th MOSFET being used as a drain terminal of the MOSFET circuit, and wherein divided voltages obtained by dividing a voltage applied across the source and drain terminals, by means of a first voltage divider circuit in which a plurality of resistors are connected in series are applied to gates of the second to n-th MOSFETs;
A high-voltage MOSFET (insulated gate field-effect transistor) circuit wherein n MOSFETs are connected in series by electrically connecting a drain of the m-th (1.ltoreq.m.ltoreq.n-1) MOSFET and a source of the (m+1)-th MOSFET, a source and gate of the first MOSFET being respectively used as a source terminal and gate terminal of the MOSFET circuit, a drain of the n-th MOSFET being used as a drain terminal of the MOSFET circuit, and wherein divided voltages obtained by dividing a voltage applied across the source and drain terminals, by means of a first voltage divider circuit in which a plurality of resistors are connected in series are applied to gates of the second to n-th MOSFETs;
A high-voltage MOSFET (insulated gate field-effect transistor) circuit wherein n MOSFETs are connected in series by electrically connecting a drain of the m-th (1.ltoreq.m.ltoreq.n-1) MOSFET and a source of the (m+1)-th MOSFET, a source and gate of the first MOSFET being respectively used as a source terminal and gate terminal of the MOSFET circuit, a drain of the n-th MOSFET being used as a drain terminal of the MOSFET circuit, and wherein divided voltages obtained by dividing a voltage applied across the source and drain terminals, by means of a first voltage divider circuit in which a plurality of resistors are connected in series are applied to gates of the second to n-th MOSFETs;
A high-voltage MOSFET (insulated gate fieldeffect transistor) circuit wherein n MOSFETs are connected in series by electrically connecting a drain of the m-th (1.ltoreq.M.ltoreq.n-1) MOSFET and a source of the (m+1)-th MOSFET, a source and gate of the first MOSFET being respectively used as a source terminal and gate terminal of the MOSFET circuit, a drain of the n-th MOSFET being used as a drain terminal of the MOSFET circuit, and wherein divided voltages obtained by dividing a voltage applied across the source and drain terminals, by means of a first voltage divider circuit in which a plurality of resistors are connected in series are applied to gates of the second to n-th MOSFETs;
Dependencies are inferred from the claim text.