Targeted infrared thermometer
AssigneeTelatemp Corporation
InventorsRichard E. Darringer, Wayne L. Scharf, James S. Haggerty
Life of this patent
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Abstract
An apparatus for use in determining the temperature of or at a specific area by measuring the infrared radiation from that area through the use of a reflector structure to direct the radiation from the area to an infrared detector can be improved by using a laser to provide two light beams which are directed so as to intersect at a distance from the apparatus corresponding to the principal focus of the reflector structure.
Claims9
An apparatus for determining temperature by measuring infrared radiation, said apparatus including an infrared radiation detector and a reflector structure for directing radiation given off at a specific area in front of and remote from said apparatus to said detector, said reflector structure including a primary reflector and a secondary reflector, said primary reflector being shaped and located so as to reflect radiation given off at said area toward said secondary reflector, said secondary reflector being shaped and located so that radiation reflected toward it by said primary reflector is reflected by it to said infrared radiation detector, said reflector structure having an optical axis, in which the improvement comprises:
- a collimated light source means mounted on said apparatus,
- beam splitting means for splitting light emitted by said light source means into two separate beams,
- a mirror positioned on said apparatus adjacent to said reflector structure so as to intercept a first of said separate beams and reflect it along said optical axis of said reflector structure,
- beam directing means positioned on said apparatus so as to intercept the other of said separate beams and to direct said other of said separate beams so that it crosses the first of said separate beams at a point remote from said apparatus.
Dependencies are inferred from the claim text.