Test sample support assembly
AssigneeThe United States of America as represented by the Secretary of the Air Force
InventorsErnest G. Wolff, Steven A. Eselun
Life of this patent
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Abstract
A test sample support assembly having its greatest utility in a length measuring device in a temperature controlled environment. The sample support assembly has a main support, a pair of insulating members and a sample support. In one embodiment of this invention the sample support is made of a substantially distortion-free material thereby precisely positioning the sample within the temperature controlled environment. In the other embodiment of this invention the sample support acts as the temperature controlling element. The sample support is adjustably mounted with respect to the main support. This adjustable feature permits corrective movement of the sample support to take place in order to compensate for the undesirable movement of the sample support.
Claims8
In a contactless length measuring device having a chamber for housing optical equipment for performing the length measurement operation of a sample and means for providing a preselected temperature within said chamber, the improvement therein being in the form of a support assembly located within said chamber for holding said sample in optical alignment with said optical equipment, said sample support assembly comprising a main support on which said optical equipment is mounted, said main support being made of a material having ultra-low expansion properties, a first insulating member juxtaposed said main support, said first insulating member being made of a material having relatively high thermal conductivity thereby substantially eliminating temperature gradients in said main support, a second insulating member juxtaposed said first insulating member, said second insulating member being made of an open porous material, means made of a thermally conductive material juxtaposed said second insulating member for supporting said sample in optical alignment with said optical equipment, said means for providing said preselected temperature being directly connected to said sample support means, and means interposed between said first insulating member and said sample support means for adjustably mounting said sample support means thereon whereby said main support and said optical equipment are rendered substantially unaffected by said preselected temperature within said chamber.
A support assembly for holding a sample in an environment of preselected temperature comprising a main support, said main support being made of a material having ultra-low expansion properties, a first insulating member juxtaposed said main support, said first insulating member being made of a material having a relatively high thermal conductivity thereby substantially eliminating temperature gradients in said main support, a second insulating member juxtaposed said first insulating member, said second insulating member being made of an open porous material, means made of a thermally conductive material juxtaposed said second insulating member for supporting said sample within said preselected temperature environment, means for providing said preselected temperature being directly connected to said sample support means, and means interposed between said first insulating member and said sample support means for adjustably mounting said sample support means thereon whereby said main support is rendered substantially unaffected by said preselected temperature.
Dependencies are inferred from the claim text.