Differential charge sensing system

A sensing system for a memory cell having first and second transistors with first and second diffusion capacitances, respectively, carrying unequal amounts of current resulting in a charge difference in said diffusion capacitances indicative of stored data comprising:

• first and second bit lines connected to said first and second diffusion capacitances, respectively, said first and second bit lines having first and second charged capacitances, respectively;
• means for maintaining said data in said cell including means for equalizing the potential on said first and second bit lines;
• means for increasing the charge in said first and second diffusion capacitances including first and second current sources connected to said first and second bit lines, respectively, and means for transferring charge from said first and second charged capacitances to said first and second diffusion capacitances, respectively;
• first and second resistors having equal magnitudes connected to said first and second bit lines, respectively;
• means for transferring said increased charge in said diffusion capacitances through said first and second resistors, said transferring means including a current switch coupled to said first and second impedances;
• and
• means for sensing the resulting voltage difference across said first and second resistors, said sensing means including a sensing latch having a pair of cross-coupled transistors connected between said first and second bit lines.

A sensing system for a memory cell having first and second transistors with first and second diffusion capacitances, respectively, carrying unequal amounts of current indicative of stored data comprising:

• first and second bit lines connected to said first and second diffusion capacitances, respectively;
• means connected to said bit lines for charging up said bit lines to maintain said data in said cells;
• means for discharging said charged bit lines through said cell to provide a significant charge difference in said first and second diffusion capacitances;
• means including voltage varying means for transferring said charge difference in said diffusion capacitances to said bit lines;
• and
• means for sensing the charge difference on said bit lines.

An integrated semiconductor system comprising:

• first and second bit lines;
• a memory cell including a pair of cross-coupled NPN transistors and first and second PNP transistors, said first PNP transistor being connected between said first bit line and said cross-coupled NPN transistors and said second PNP transistor being connected between said second bit line and said cross-coupled NPN transistors;
• first and second gated current sources connected to said first and second bit lines, respectively;
• gated circuit means connected between said first and second bit lines for maintaining data in said memory cell;
• first and second resistors connected to said first and second bit lines, respectively;
• means coupled to said first and second bit lines through said first and second resistors for selectively varying the voltage at said resistors;
• and
• a sense amplifier latch connected between said first and second bit lines, said sense amplifier latch including a pair of cross-coupled bipolar transistors.

An integrated semiconductor system comprising:

• a plurality of pairs of bit lines;
• a plurality of memory cells connected between each pair of said lines, each of said cells having first and second transistors, each having first and second diffusion capacitances connected to said bit lines carrying unequal amounts of currents resulting in a charge difference in said diffusion capacitances indicative of stored data;
• means coupled to each pair of said plurality of pairs of bit lines for maintaining said data in said cells;
• means for increasing the charge in the first and second diffusion capacitances of a selected cell;
• a plurality of first and second impedances having equal magnitudes connected to said pairs of bit lines;
• means for transferring said increased charge in the diffusion capacitances of said selected cell through said first and second impedances coupled to said selected cell;
• a pair of common nodes;
• means coupled to said pair of common nodes through diodes for sensing a resulting voltage difference developed across the first and second impedances coupled to said selected cell;
• and
• data out latching means coupled to said pair of common nodes and to said sensing means.

A sensing system for a memory cell having first and second transistors with first and second diffusion capacitances, respectively, carrying unequal amounts of currents resulting in a charge difference in said diffusion capacitances indicative of stored data comprising:

• first and second bit lines connected to said first and second diffusion capacitances, respectively;
• means for maintaining said data in said cell;
• means for increasing the charge in said first and second diffusion capacitances;
• first and second impedances having equal magnitudes connected to said first and second bit lines, respectively;
• means including a gated current source coupled to said first and second impedances for transferring said increased charge in said diffusion capacitances through said first and second impedances;
• and
• means for sensing a resulting voltage difference across said first and second impedances.

An integrated semiconductor system comprising:

• a plurality of pairs of bit lines;
• a plurality of memory cells connected between each pair of said lines, each of said cells having first and second transistors, each having first and second diffusion capacitances connected to said bit lines carrying unequal amounts of currents resulting in a charge difference in said diffusion capacitances indicative of stored data;
• means coupled to each pair of said plurality of pairs of bit lines for maintaining said data in said cells;
• means for increasing the charge in the first and second diffusion capacitances of a selected cell;
• a plurality of first and second impedances having equal magnitudes connected to said pairs of bit lines;
• means for transferring said increased charge in the diffusion capacitances of said selected cell through said first and second impedances coupled to said selected cell, said transferring means including voltage varying means connected to the first and second impedances coupled to said selected cell;
• means for sensing a resulting voltage difference developed across the first and second impedances coupled to said selected cell;
• and
• data out latching means coupled to said sensing means.