Electrical circuit testing
AssigneeMeasurement Technology Limited
InventorsDavid W. Hawkes, Ian C. Hutcheon
Life of this patent
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Abstract
A method of testing operation of an electrical circuit involves supplying a test signal to circuit terminals (1 to 4), which signal may be a pulsed signal, to the circuit, thereby to switch off a switch component (ZD1). When the circuit is in this condition, further test signals may be applied to the terminals (1 to 4) to test operation of other circuit components (11, 12, 13, ZD2). The method is particularly applicable to circuits, e.g. diode safety barriers, that are encapsulated and require testing after encapsulation, when only terminals (1 to 4) are exposed for connection into an external circuit.
Claims13
A method of testing operation of an electrical circuit, the circuit having a plurality of current paths therethrough and a component capable of changing the impedance of one of said paths, in which method at least one electrical test signal is applied to said circuit to cause said component to change said impedance thereby to permit testing of at least one other component of said circuit.
A method of testing operation of an electrical circuit, the circuit comprising first and second terminals, first switching means and first resistance means connected together in series and interconnecting said first and second terminals, third and fourth terminals, second switching means interconnecting said third and fourth terminals, second resistance means connecting said third terminal to the junction between said first switching means and said first resistance means, and a conductor interconnecting said second and fourth terminals, which method comprises passing current through said second resistance means thereby to render one of said switching means open circuit, and testing the other of said switching means and said first and second resistance means.
Dependencies are inferred from the claim text.