Automatic circuit tester with improved voltage regulator

An automatic circuit testing apparatus comprising in combination:

• a receptacle means for providing electrical contact with a unit under test;
• at least one integrated circuit input/output memory device including memory, at least one input/output port, a data bus, a port/memory selector pin connected to a signal source corresponding to selection of memory, a read input responsive to an active state thereon to read onto said data bus data from said memory when said port/memory selector pin is in a first state and to read onto said data bus data from said input/output port when said port/memory selector pin is in a second state, a port read input responsive to an active state thereon to cause data present at said input/output port to be provided onto said data bus and a port write input responsive to an active state thereon to write data present on said data bus to said input/output port;
• a microcomputer including a microcomputer data bus, a write output for providing an active output state in response to said microcomputer executing an instruction to write data present on said computer data bus to an external device, a read output having an active state corresponding to said microcomputer accepting data from said computer data bus and a program store output having an active state corresponding to said computer seeking to accept data on said computer data bus as an instruction;
• means for electrically connecting said input/output port and said receptacle means;
• and
• means for connecting said microcomputer to said integrated circuit input/output memory device including a means for connecting said computer data bus to said data bus, a connection between said write output and said port write input, a connection between said read output and said port read input, and a connection between said program store output and said read input.