Beam current normalization in an X-ray microanalysis instrument
AssigneeTracor Northern, Inc.
InventorsFrederick H. Schamber, Jon J. McCarthy
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AssigneeTracor Northern, Inc.
InventorsFrederick H. Schamber, Jon J. McCarthy
Estimating the term…
X-ray spectral data are normalized to beam current by basing data accumulations upon a fixed beam current integral rather than a fixed acquisition time. A current proportional to beam current is obtained from an aperture in an electron column instrument to provide a continuous monitor of beam current during data accumulation. The current is applied to a digital current integrator producing output pulses at a frequency proportional to the current. Connected to the digital current integrator is a one-shot producing a pulse of fixed width for each integrator pulse. The interval between one-shot pulses is defined as "delay time," and a signal representative of that time interval is produced and utilized to control the actual analysis time such that a prescribed beam current integral is obtained. The delay time signal may be combined with the normal system dead time signal to derive an effective dead time signal for controlling the length of actual analysis time to correct for variations in beam current as well as system dead time.
In an electron column instrument for quantitative energy dispersive x-ray microanalysis including an optical system for establishing a focused electron beam of a preset beam current level directed onto an analysis specimen, means for analyzing the spectrum of x-rays emitted from the specimen to accumulate a count of x-ray intensities, and an elapsed time counter for timing out an analysis time period, the improvement comprising:
In an electron beam column instrument for quantitative energy dispersive x-ray microanalysis including an optical system for establishing a focused electron beam flux of a preset probe current level directed onto an analysis specimen, means for analyzing the spectrum of x-rays emitted from the specimen to accumulate a count of x-ray intensities, an oscillator producing clock pulses, an elapsed time counter receiving clock pulses for timing out an analysis time period, the improvement comprising:
Apparatus for providing beam current normalization in an EDS analyzer having an elapsed analysis time counter, which comprises:
Apparatus for providing beam current normalization in an EDS analyzer having a dead time control section producing a dead time signal and a timer responsive to the dead time signal for establishing the length of an analysis time period, which comprises:
In an electron column instrument for quantitative energy dispersive x-ray microanalysis which includes an optical system for establishing a focused electron beam of a preset beam current level directed onto an analysis specimen, a solid state detector for detecting x-rays emitted from the analysis specimen, signal processing circuitry coupled to the solid state detector for producing a voltage pulse representative of detected x-rays, a pulse height analyzer for analyzing the spectrum of x-rays detected and accumulating a count of x-ray intensities, an elapsed time counter for timing out an analysis time period, an oscillator generating clock pulses to drive the counter, a clock gate coupling the oscillator to the counter for inhibiting or allowing the passage of clock pulses to the counter, and a dead time control circuit for generating a signal indicative of the time period the signal processing circuitry and the analyzer require to process and analyze a detected x-ray, the improvement comprising:
Dependencies are inferred from the claim text.