Solid-state imaging apparatus with fixed pattern noise reduction
AssigneeHitachi, Ltd.
InventorsMorishi Izumita, Masuo Umemoto, Kazuhiro Sato, Toshiyuki Akiyama, Kenji Takahashi, Shusaku Nagahara
Life of this patent
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Abstract
A solid-state imaging apparatus comprising first means for sample-holding spike noise generated from a horizontal switching element constituting the apparatus second means for sample-holding spike noise opposite in phase to the first-mentioned spike noise, and third means for adding outputs of the first and second means.
Claims12
In a solid-state imaging apparatus having photoelectric elements which form picture elements and switch means for individually reading out signals derived from said photoelectric elements, the solid-state imaging apparatus further comprising first and second sample-holding means for obtaining samples of a signal having noise therein derived from said switch means and holding said samples, pulse generator means for applying sampling pulses to said first and second sample-holding means at predetermined times different from each other, and calculating means for subjecting outputs from said first and second sample-holding means to predetermined calculations for reducing the noise in the signal derived from said switch means and for providing a reduced noise output signal.
In a solid-state imaging apparatus having photoelectric elements which are arrayed in two dimensions, a plurality of first switching elements whose input terminals are connected to the corresponding photoelectric elements, a plurality of second switching elements whose input terminals are connected to output terminals of the first switching elements, a first scanner which applies first scanning pulses to control terminals of the first switching elements, a second scanner which applies second scanning pulses to control terminals of the second switching elements, and at least one read-out line to which output terminals of the second switching elements, the solid-state imaging apparatus further comprising first and second sample-holding circuits connected to said read-out line for obtaining and holding samples of signals having noise therein derived through said read-out line from each said second switching element, a pulse generator connected to said first and second sample-holding circuits for applying sampling pulses to said first and second sample-holding circuits at predetermined times different from each other, and calculating means connected to said first and second sample-holding circuits for subjecting outputs from said first and second sample-holding circuits to predetermined calculations to reduce the noise in the signal derived through said read-out line and for providing a reduced noise output signal.
Dependencies are inferred from the claim text.