Latch circuit operable as a D-type edge trigger
AssigneeInternational Business Machines Corporation
InventorsDavid J. Brown, Ronald G. Walther, Thomas W. Williams, Michael D. Wrigglesworth
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AssigneeInternational Business Machines Corporation
InventorsDavid J. Brown, Ronald G. Walther, Thomas W. Williams, Michael D. Wrigglesworth
Estimating the term…
A shift register latch circuit (FIG. 1) comprised of a polarity hold latch 1 connected to a set/reset latch 2. The latches can be clocked with separate non-overlapping clock trains (+A, +B and +C) so that automatically generated test patterns can be applied to a scan input S to test the circuit. This conforms to the so-called Level Sensitive Scan Design (LSSD) rules. During system operation, the shift register latch circuit operates as a `D` type edge trigger by connecting the clock input +B of the set/reset latch 2 to the clock -C supplied to the polarity hold latch 1. By connecting a number of shift register latches together a Johnson counter can be formed and by clocking all latches with a single oscillator, a series of non-overlapping clock trains can be produced. Implementations of the shift register latch in AND circuits or AND OR INVERT circuits are described.
A shift register latch circuit for use in an integrated circuit conforming to Level Sensitive Scan Design (LSSD), said shift register latch circuit comprising:
A shift register latch circuit for use in an integrated circuit conforming to Level Sensitive Scan Design (LSSD), said shift register latch circuit comprising:
Dependencies are inferred from the claim text.