Defect detection system
AssigneeSparton Corporation
InventorsFrederick A. Cole, Ronald L. Deak
Life of this patent
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Abstract
The invention pertains to a defect detection system for inspecting fabric wherein fabric is scanned by electronic light-sensing apparatus for inconsistencies in light reflecting capability and defects produce electronic signals which are counted, and preferably, are automatically counted with respect to a predetermined time interval wherein fabric manufacturing apparatus may be automatically monitored to maintain a predetermined quality of product. Preferably, infrared frequencies are utilized for defect sensing purposes and electronic signal retention counting and timing apparatus automatically terminates fabric production if defect occurence exceeds a predetermined frequency in a given time interval.
Claims7
A defect detection system for inspecting tubular fabric wherein the fabric tube rotates about its longitudinal axis and is substantially axially translated during inspection wherein relative movement occurs between the fabric tube and fixed defect detection apparatus, comprising, in combination, electronic sensing means sensing a fabric portion having an axial length greater than the fabric axial translation during each revolution for detecting a defect in the fabric and having an electrical output producing a signal upon a defect being sensed, electronic signal counting apparatus connected to said output receiving and counting signals from said sensing means, timing apparatus associated with said signal counting apparatus whereby the number of signals produced within a predetermined interval of time can be determined, control apparatus connected to said signal counting and timing apparatus producing a control output signal upon a predetermined number of defect signals occurring while a predetermined time interval and defect indentification means incorporated into said signal counting apparatus, said defect identification means recognizing repetitive defect signals within a given time interval to produce a single signal for defect determination purposes.
Dependencies are inferred from the claim text.