Measuring system
AssigneeLeeds & Northrup Company
InventorsDavid L. Fletcher, Walter O. Stadlin
Life of this patent
Estimating the term…
Abstract
There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.
Claims5
The method for measuring a parameter whose value is calculable as the integral with time of a function of at least one variable which has a value following a periodic wave form, comprising the steps of:
- sampling the value of said variable periodically at a frequency asynchronous with said wave form;
- and
- periodically calculating the value of the integral of the function in accordance with the sum of the values for the function determined in accordance with the values of all of the samples taken during the time between said calculations.
Dependencies are inferred from the claim text.