Television monitoring system for automatically aligning semiconductor devices during manufacture
AssigneeTeledyne, Inc.
InventorNorman G. Altman
Life of this patent
Estimating the term…
Abstract
In a system for aligning successive configurations of minute semiconductors during manufacture, any selected configuration is carried on a precision X,Y,.theta. table, which is under the automatic control of (1) a standard television camera that is subject to conventional geometrical and shading distortions, (2) pattern-recognition and motor-control circuitry that corrects these distortions so that precision alignment is possible, and (3) a monitor including a television viewing screen for supervising the system.
Claims27
For use in a system for aligning successive like semiconductor configurations, each characterized by a set of perpendicularly intersecting visual elements, said system comprising table means for adjustably carrying and optically presenting any one of said semiconductor configurations, drive means for causing said table motions in X, Y, and .theta. directions, television camera means directed toward said table means for viewing any one of said semiconductor configurations on said table means, said television camera means being characterized by a raster of scan lines and producing pattern recognition signals corresponding to said scan lines, and television monitor means characterized by a raster of scan lines for displaying a representation of any one of said semiconductor configurations being carried on said table means:
- (a) electronic control means operatively connected between said television camera means and said table means and between said television camera means and said television monitor means;
- (b) said electronic control means including memory means for storing representations of said pattern recognition signals;
- (c) manual supervision means for energizing said drive means in order to align a set of perpendicularly intersecting visual elements on a reference one of said semiconductor configurations, thereby generating reference pattern recognition signals and storing reference representations thereof in said memory means;
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- (d) automatic supervision means for comparing pattern recognition signals generated from a semiconductor configuration to be aligned on said table means and reference pattern recognition signals corresponding to said reference representations in said memory means, thereby energizing said drive means for aligning said set of perpendicular elements on said semiconductor configuration to be aligned.
A system for aligning successive like semiconductor configurations, each characterized by a selected set of perpendicularly intersecting visual elements, said system comprising:
- (a) table means for adjustably carrying and optically presenting any one of said semiconductor configurations, guide means for constraining said table means for motions in X, Y, and .theta. directions, and drive means for causing said motions;
- (b) television camera means directed toward said table means for viewing any one of said semiconductor configurations on said table means, said television camera means being characterized by a raster of scan lines and producing pattern recognition signals corresponding to said scan lines;
- (c) television monitor means characterized by a raster of scan lines for displaying a representation of any one of said semiconductor configurations being carried on said table means;
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- (d) electronic control means operatively connected between said television camera means and said table means and between said television camera means and said television monitor means, said electronic control means including memory means for storing representations of said pattern recognition signals, manual supervision means for energizing said drive means in order to align a selected set of perpendicularly intersecting visual elements on a reference one of said semiconductor configurations, thereby generating reference pattern recognition signals and storing reference representations thereof in said memory means, and automatic supervision means for comparing selected pattern recognition signals corresponding to a selected semiconductor configuration on said table means and reference pattern recognition signals corresponding to said reference representations in said memory means, thereby energizing said drive means for aligning said selected set of perpendicularly intersecting elements on said selected semiconductor configuration.
A system for utilizing X sensing means and Y sensing means at the center of an X,Y coordinate field for aligning a minute semiconductor configuration with respect to said center, said semiconductor configuration being characterized by a set of perpendicularly intersecting vertical and horizontal visual elements and being capable of X,Y and .theta. motions, said system comprising:
- (a) means for commanding first X motion until a vertical visual element on an inner section of said configuration is sensed by said X sensing means;
- (b) means for commanding first Y motion until an edge of said configuration is sensed by said Y sensing means;
- (c) means for commanding first .theta. motion until X displacement, as sensed by said X sensing means, is corrected;
- (d) means for commanding second Y motion, in the sense opposite that of said first Y motion, until a horizontal visual element is sensed by said Y sensing means;
- (e) the intersection of selected vertical and horizontal visual elements thereby being centered coarsely;
- (f) means for commanding third Y motion in the sense like that of said first Y motion, until said edge of said configuration is sensed by X sensing means;
- (g) mens for commanding second .theta. motion until X displacement, as sensed by said X sensing means, is corrected;
- (h) means for commanding fourth Y motion in the sense like that of said second Y motion, until said horizontal visual element is sensed by said Y sensing means;
- (i) the intersection of said selected vertical and horizontal visual elements thereby being centered finely.
A system for aligning successive like semiconductor configurations with respect to a reference point in an X, Y coordinate field, each one of said configurations being characterized by a selected reference point at the intersection of generally perpendicularly related visual elements including a selected vertical element and a selected horizontal element, said system comprising:
- (a) X, Y sensing means communicating with said X, Y coordinate field;
- (b) X, Y, .theta. motion means for moving one of said configurations in said X, Y coordinate field;
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- (c) control means operatively connected between said X, Y sensing means and said X, Y, .theta. motion means;
- (d) said control means commanding X motion of said X, Y, .theta. motion means until said selected vertical visual element is sensed by said X, Y sensing means, said selected vertical element thereby being centered coarsely;
- (e) said control means commanding a first relatively large Y motion of said X, Y, .theta. motion means until a selected edge of said one of said configurations is sensed by said X, Y sensing means, .theta. error thereby appearing as X displacement;
- (f) said control means correcting said .theta. error by .theta. motion of said X, Y, .theta. motion means;
- (g) said control means commanding a second relatively large Y motion of said X, Y, .theta. motion means in the sense opposite that of said first relatively large Y motion in order to return said reference point of said one of said configurations to the region of said reference point of said field of view;
- (h) said control means commanding additional Y motion of said X, Y, .theta. motion means until said selected horizontal element is sensed by said X, Y sensing means, said selected reference point of said one of said configurations thereby being centered coarsely;
- (i) said control means commanding a third relatively large Y motion of said X, Y, .theta. motion means until said selected edge is sensed by said X, Y sensing means;
- (j) said control means commanding relatively fine Y motion and .theta. motion of said X, Y, .theta. motion means, thereby providing fine .theta. correction at said selected edge of said one of said configurations;
- (k) said control means commanding a fourth relatively large Y motion of said X, Y, motion means in the sense opposite that of said third relatively large Y motion;
- (l) said control means commanding additional Y motion until said selected horizontal element is sensed by said X, Y sensing means, whereby said selected reference point of said one of said configurations substantially coincides with said selected reference point of said field of view.
A process for aligning successive like semiconductor configurations with respect to a reference point in an X, Y coordinate field, each one of said configurations being characterized by a selected reference point at the intersection of generally perpendicularly related visual elements including a selected vertical element and a selected horizontal element, said system comprising X, Y sensing means communicating with said X, Y coordinate field, X, Y, .theta. motion means for moving one of said configurations in said X, Y coordinate field, and control means operatively connected between said X, Y sensing means and said X, Y, .theta. motion means, said process comprising the steps of:
- (a) commanding, via said control means, X motion of said X, Y, .theta. motion means until said selected vertical visual element is sensed by said X, Y sensing means, said selected vertical element thereby being centered coarsely;
- (b) commanding, via said control means, a first relatively large Y motion of said X, Y, .theta. motion means until a selected edge of said one of said configurations is sensed by said X, Y sensing means, .theta. error thereby appearing as X displacement;
- (c) correcting, via said control means, said .theta. error by .theta. motion of said X, Y, .theta. motion means;
- (d) commanding, via said control means, a second relatively large Y motion of said X, Y, .theta. motion means in the sense opposite that of said first relatively large Y motion in order to return said reference point of said one of said configurations to the region of said reference point of said field of view;
- (e) commanding, via said control means, additional Y motion of said X, Y, .theta. motion means until said selected horizontal element is sensed by said X, Y sensing means, said selected reference point of said one of said configurations thereby being centered coarsely;
- (f) commanding via said control means a third relatively large Y motion of said X, Y, .theta. motion means until said selected edge is sensed by said X, Y sensing means;
- (g) commanding, via said control means, relatively fine Y motion and .theta. motion of said X, Y, .theta. motion means, thereby providing fine .theta. correction at said selected edge of said one of said configurations;
- (h) commanding, via said control means, a fourth relatively large Y motion of said X, Y, .theta. motion means in the sense opposite that of said third reltatively large Y motion;
- (i) commanding, via said control means, additional Y motion until said selected horizontal element is sensed by said X, Y sensing means, whereby said selected reference point of said one of said configurations substantially coincides with said selected reference point of said field of view.
Dependencies are inferred from the claim text.