Method for measuring the density of lightweight materials
AssigneeThe United States of America as represented by the United States Department of Energy
InventorsSamuel G. Snow, Edward J. Giacomelli
Life of this patent
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Abstract
This invention relates to a nondestructive method for measuring the density of articles composed of elements having a low atomic number such as plastic and carbon composites. The measurement is accomplished by striking the article with a collimated beam of X radiation, simultaneously monitoring the radiation scattered and the radiation transmitted by the article, then relating the ratio of the radiation scattered to the radiation transmitted with the density of the article. The above method is insensitive to all variables except density.
Claims2
A method for determining the density of lightweight materials having low atomic numbers including plastics and carbon composites comprising the steps of:
- directing a collimated beam of X-radiation onto a sample of lightweight material at a fixed oblique angle of incidence such that the scattered X-ray path length is equal to the transmitted X-ray path length within said sample;
- simultaneously measuring the X rays transmitted and scattered by said sample with a first detector for measuring the transmitted radiation positioned in alignment with said beam of X radiation on that side of said sample opposite the origin of said beam and with a second detector for measuring scattered radiation positioned at an acute angle with respect to the first detector on that side of said sample opposite the origin of the radiation beam;
- determining the ratio of the radiation scattered to the radiation transmitted;
- and
- comparing said ratio with ratio values determined from corresponding measurements of standards having known densities that were prepared from similar material for determining the density of said sample material independent of the thickness thereof.
Dependencies are inferred from the claim text.