Method of detecting high energy radiation via a bismuth oxide compound
AssigneeSiemens Aktiengesellschaft
InventorsHelmut Thomann, Christa Grabmaier
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AssigneeSiemens Aktiengesellschaft
InventorsHelmut Thomann, Christa Grabmaier
Estimating the term…
X-rays or .gamma.-rays are detected by irradiating a beam of high energy radiation onto a crystalline bismuth oxide compound having the formula Bi.sub.10-14 X.sub.1 O.sub.n wherein X is at least one element selected from the group consisting of Al, Ga, Ge, Si and Ti and n is a numeral substantially equal to the stoichiometric amount of oxygen within the compound. The above bismuth oxide crystalline compound may be placed in a radiation dosimeter or be applied as a radiation-sensitive coating on a cylinder or plate of an apparatus for producing electrostatic copies (i.e., an in a xerographic process or the like).
A dosimeter for detecting X-rays and .gamma.-rays comprising:
Dependencies are inferred from the claim text.
Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation: measuring radiation intensity
Characterised by the photoconductive material being inorganic: and not being incorporated in a bonding material, e.g. vacuum deposited
Measurement of nuclear or x-radiation
Electrography
Term ended 7 Oct 1997 (estimated)
USPTO file history isn’t available for this patent, so only indexed dates are shown.
1. Field of the Invention
The invention relates to a novel method of detecting certain radiant energy, such as X-rays or .gamma.-rays and somewhat more particularly to a method of detecting such energy via a crystalline bismuth oxide compound.
2. Prior Art
FIG. 1 is a somewhat schematic view, partially broken away, of an embodiment of a radiation dosimeter useful in the practice of the invention.
The invention provides a novel method of detecting relatively high energy radiation, such as X-rays, .gamma.-rays and other like short wavelength radiant energy.
In accordance with the principles of the invention, X-rays, .gamma.-rays and other like radiant energy is detected by irradiating a beam of such radiant energy onto a crystalline bismuth oxide compound having the formula:
Bi.sub.10-14 X.sub.l O.sub.n