Device for shifting frozen specimen, for use in scanning type electron microscope
AssigneeHitachi, Ltd.
InventorsAkimitsu Okura, Syobu Saito, Motohide Ukiana
Life of this patent
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AssigneeHitachi, Ltd.
InventorsAkimitsu Okura, Syobu Saito, Motohide Ukiana
Estimating the term…
A specimen holder holding a frozen specimen is adapted to engage the opened end of a recess in a specimen support, such that the frozen specimen is exposed to the inside of the recess. The mutually engaging specimen holder and the specimen support are shifted to a specimen chamber. In the specimen chamber, the specimen holder is separated from the specimen support and is received by a specimen receiving chamber. The specimen holder received by the specimen receiving member can be moved together with the latter to a specimen treating chamber. Cooling means for cooling the specimen receiving member is unitarily secured to the specimen receiving member, so as to be moved together with the specimen receiving member.
A device for shifting frozen specimen for use in scanning type electron microscope comprising:
Dependencies are inferred from the claim text.