Circuit board contact contamination probe
AssigneeBell Telephone Laboratories, Incorporated
InventorsThomas G. Grau, David E. Tompsett
Life of this patent
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AssigneeBell Telephone Laboratories, Incorporated
InventorsThomas G. Grau, David E. Tompsett
Estimating the term…
Apparatus for detecting the presence of contamination films and foreign material on the conducting fingers of a circuit board. The apparatus includes a guide block assembly (11) designed to receive and momentarily hold a circuit board (100) and a spring biased hold down bar (25) for securely holding the circuit board in the guide block assembly. The apparatus further includes apparatus (23, 31) for use in positioning a plurality of probe assemblies (33) to simultaneously engage a pair of electrodes (330) with each one of the circuit board conducting fingers (101). A controller (43) enables switch apparatus (42) to selectively connect each pair of electrodes with electrical resistance measuring apparatus (50) to measure the resistance of any contamination film and foreign material appearing on a circuit board conducting finger between the electrodes of each electrode pair.
Apparatus for testing circuit boards (100), said apparatus having
Apparatus for testing circuit boards (100), said apparatus having
Apparatus for testing circuit boards (100), said apparatus having
Apparatus for testing conducting fingers of a circuit board, said apparatus comprising
A method of testing a circuit board with test apparatus comprising a probe assembly having electrodes comprised of a needle member and a contact member corresponding to each circuit board conducting finger, guide apparatus for receiving a circuit board, and electrical resistance measuring means, said method comprising the steps of
Dependencies are inferred from the claim text.