US 4,190,770 A · Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material

Abstract

A backscatter measurement device for measuring the thickness of a coating on elements forming a web of substrate material moving from a feed supply to a take-up location at a predetermined speed. A measurement wheel is provided, adjacent to the rim of which is mounted a backscatter probe for irradiating and detecting the backscattered radiation from a coated substrate. The web of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving web whereby the probe and an adjacent point on the web are stationary relative to one another while the point on the web is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated web. This backscatter measurement device is further provided with indexing apparatus to position automatically the probe directly adjacent an element to be measured on the web.

Claims9

Dependent claims

In a backscatter measuring device for measuring the thickness of a coating on an element of substrate material forming a portion of a web, the web having indexing means along an edge thereof and being moved continuously from a feed supply to a take-up location the improvement comprising:

a probe head having a probe means for irradiating the coating on the coated substrate material and detecting the backscatter radiation during a measurement period and having locating means for engaging the indexing means;
the probe means and the locating means being positioned on the probe head in the same relation as the element to be measured and the indexing means are positioned on the web;
a probe holding assembly for holding the probe head in adjacent relation with the web during the measurement period and being mounted to move the probe head along the longitudinal axis of the web;
means for causing the probe holding assembly to move the probe head along the longitudinal axis of the web just prior to the measurement period until the locating means engages the indexing means whereby the probe means is properly aligned with the coated element to be measured.

1 more element

A backscatter measuring device for measuring the thickness of a coating on an element of substrate material forming a portion of a web, the web having indexing means along an edge thereof and being moved continuously at a predetermined speed from a feed supply to a take-up location comprising:

a measurement wheel having a rim and an axle of rotation and being rotated at a speed of rotation such that the tangential speed of a point on the rim is equal to the predetermined speed of the moving webs;
means for feeding the web into frictional engagement with an outer portion of the rim in a direction such that the direction of movement of the web corresponds to the direction of rotation of the rim whereby a point on the rim of the measurement wheel and an adjacent point on the web are stationary relative to one another while the measurement wheel is rotating;
a probe head having a probe means for irradiating the coating on the coated substrate material and detecting the backscatter radiation during a measurement period and having locating means for engaging the indexing means;
the probe means and the locating means being positioned on the probe head in the same relation as the element to be measured and the indexing means are positioned on the web;
a probe holding assembly mounted adjacent a rim of the measurement wheel for holding the probe head in adjacent relation with the web during the measurement period and being mounted to move the probe head along the longitudinal axis of the web on the measurement wheel;
actuating means for causing the probe holding assembly to move the probe head along the longitudinal axis of the web just prior to when the element of the web to be measured is about to engage the outer portion of the rim on the measurement wheel until the locating means engages the indexing means whereby the probe means is properly aligned with the coated element to be measured.

3 more elements

Dependencies are inferred from the claim text.

Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material

Life of this patent

Backscatter instrument having indexing feature for measuring coating thickness of elements on a continuously moving web of substrate material

Life of this patent

Abstract

Claims9