Electron probe testing, analysis and fault diagnosis in electronic circuits
OwnerGraham S. Plowsinventor
Life of this patent
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Abstract
A method of testing electronic networks in which an electron probe is moved from point to point in the network and a current of secondary electrons emitted in response to the impingement of the probe is converted to a signal denoting voltage or field strength at the various points. A scanning apparatus in which an electronic collector including grids in the path of the beam and an annular scintillator is described.
Claims7
A method of testing the operation of, and diagnosing faults in, a finished electronic circuit, which has accessible terminals requiring particular energization when the circuit is operational, the method comprising the steps of:
- applying to the said terminals of the electronic circuit signals corresponding to those which the circuit requires for normal operation;
- directing an electron probe comprising a beam of electrons at a succession of points in the network in an orderly sequence;
- producing during a respective dwell time a steady current of secondary electrons emitted from each of the points in the network in response to impingement of the probe on the circuit;
- providing during the dwell time a potential barrier filter to the current of secondary electrons and thereby permitting passage of the secondary electron current according to the potential difference between the test point and a predetermined filter potential;
- and
- converting the current of secondary electrons into a signal representative of the value of at least the voltage, exhibited by the network at each of the succession of points.
A method according to claim 6, in which the various points are disposed in substantially a common plane which is substantially normal to the direction of the electron probe and the conversion of secondary electrons into the said signal is performed by means of a collector which includes an electronically transmissive grid disposed parallel to the said plane and a receptor, disposed laterally of the electron probe and to which secondary electrons accelerated by the aforementioned grid are directed.
An electron probe scanning apparatus comprising:
- an electron gun for the production of a focused electron probe;
- a scanning control for the probe;
- holder means for supporting an electronic network at a location suitable for longitudinal impingement and transverse scanning of points in the network by the probe;
- said holder means including means for applying to said network signals corresponding to those required by the circuit for normal operation;
- a collector comprising mutually parallel first and second electronically transmissive grids disposed adjacent said specimen holder means between it and said electron gun, the pitch and bar widths of said grid being selected to ensure negligible effect of said grids on said electron probe;
- a receptor situated transversely displaced from the path of the probe;
- means for energizing said grids for the attraction of secondary electrons from the specimen and the transmission of a fraction of said secondary electrons to said receptor after transit of the said fraction through the second grid;
- and
- means coupled to said receptor for producing a quantitative indication of electrons received at said receptor as a measure of the voltage at the points scanned by said probe.
Dependencies are inferred from the claim text.