Cross-flow reactor
AssigneeTylan Corporation
InventorAlfred R. Dozier
Life of this patent
Estimating the term…
Abstract
A cross-flow reactor for single pass reaction of a plurality of semiconductor wafers with process gas at spaced locations within a heated reactor chamber. The process gas flows along a heated length of the chamber, counterflows to at least three spaced locations within the chamber, traverses the longitudinal axis of the chamber at the spaced locations and then exhausts from the chamber. In a particular embodiment, two or more different process gases are delivered as separate streams to the spaced locations for convergent cross-flowing thereat.
Claims15
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar surfaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- and
- means for exhausting said gas flows from said chamber after said single pass;
- said distributing means comprising at least one elongate manifold tube, for receiving said process gas, disposed longitudinally within said chamber along said heated chamber length and formed with an opening at each said location for cross-flow therefrom of said process gas, said manifold tube being formed with a closed end downstream of said heated chamber length and wherein said distribution means includes at least one imperforate conduit tube within and extending along said manifold tube for delivering said process gas along said heated chamber length for counterflow of said process gas in said manifold tube from said closed end to said locations.
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar surfaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof, comprising at least two elongate manifold tubes, for receiving said process gas, disposed longitudinally coextensive within said chamber along said heated chamber length and each formed with an opening at each said location for cross-flow therefrom of said process gas, the respective openings of two of said coextensive tubes being in confronting alignment;
- and
- means for exhausting said gas flows from said chamber after said single pass.
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar surfaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within and disposed along the top of said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- and
- means for drawing said cross-flowed gas along the bottom of said chamber to exhaust said gas flows from said chamber after said single pass;
- said carrier means comprising an elongate carrier for said units of material disposed longitudinally within said chamber along the bottom thereof for disposing sai units in respective ones of said paths for single pass contact thereof with said gas, and defining a region of said chamber below said carrier as a plenum for exhaust process gas.
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar surfaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- and
- means for exhausting said gas flows from said chamber after said single pass;
- said distributing means comprising at least one elongate manifold tube, for receiving said process gas, disposed longitudinally within said chamber along said heated chamber length and formed with an opening at each said location for cross-flow therefrom of said process gas, said distribution means further comprising at least one elongate imperforate conduit tube disposed longitudinally within said chamber along said heated chamber length and returning along said length as said manifold tube.
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar surfaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- and
- means for exhausting said gas flows from said chamber after said single pass;
- said distributing means comprising at least two elongate manifold tubes, for receiving said process gas, disposed longitudinally within said chamber coextensive along said heated chamber length and each formed with an opening at each said location for cross-flow therefrom of said process gas, said distribution means including means for introducing first process gas in one of said manifold tubes at one end of said heated chamber length and second process gas in a second of said manifold tubes at the opposite end of said heated chamber length.
A cross-flow reactor for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- means for defining an elongate chamber into which can be inserted said plurality of units of semiconductor material which are to be contacted with process gas;
- carrier means for disposing said units with their planar sufaces vertically directed;
- means for heating said chamber along a substantial length thereof to a desired temperature sufficient for desired reaction of said process gas with said semiconductor material;
- means for distributing process gas to a plurality of at least three discrete locations within said chamber spaced from each other and spaced inwardly from the ends of said chamber length for travel of said gas across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- and
- means for exhausting said gas flows from said chamber after said single pass;
- said distributing means comprising at least one elongate manifold tube, for receiving said process gas, disposed longitudinally within said chamber along said heated chamber length and formed with an opening at each said location for cross-flow therefrom of said process gas, said manifold tube being closed downstream of said heated chamber length and wherein said distribution means additionally comprises first and second imperforate conduit tubes within and extending along said manifold tube for delivering first and second process gases, respectively, along said heated chamber length for mixing of said process gases and counterflow of said mixed gases from said closed end to said locations.
A cross-flow, hot wall reactor, for processing of a plurality of at least three units of semiconductor material, each unit being formed of a wafer having a substantially planar surface, comprising:
- an elongate tubular wall defining a chamber into which can be inserted carrier means for disposing said units of semiconductor material with their planar surfaces vertically directed;
- means for heating said wall along a substantial length thereof;
- at least one elongate manifold tube closed at one end and disposed longitudinally within said chamber adjacent the top inner surface of said wall and formed lengthwise with a plurality of at least three discrete openings spaced from each other and spaced inwardly from the opposite ends of said heated wall for cross-flow therefrom of said process gas so that said gas travels across the longitudinal axis of said chamber as gas flows along a plurality of spaced paths for single pass traversal thereof;
- at least one imperforate conduit tube within and extending along said manifold tube for delivering said process gas along said heated length for counterflow of said process gas in said manifold tube from said closed end to said locations;
- and
- means for exhausting said gas flows from said chamber after said single pass.
Dependencies are inferred from the claim text.