X-ray testing system
AssigneeThe Machlett Laboratories, Inc.
InventorsJonathan S. Shapiro, Vincent Berluti, Jr., Anthony Pellegrino, Howard G. Wagner
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AssigneeThe Machlett Laboratories, Inc.
InventorsJonathan S. Shapiro, Vincent Berluti, Jr., Anthony Pellegrino, Howard G. Wagner
Estimating the term…
An X-ray tube test system comprising signal processing circuitry including means for converting an analog signal representative of anode current into a train of pulses having an instantaneous frequency proportional to corresponding instantaneous amplitude values of the analog signal, means for counting the pulses in the train during an exposure time interval to obtain an integrated milliampere-second (MAS) value, means for summing a train of pulses having a uniform frequency during an interval of time equivalent to the exposure time interval to obtain an integral value for the exposure time, means for optionally dividing the MAS value by the exposure time value to obtain an average anode current (MA) value during the exposure time interval, and means for displaying numerical equivalents of the values thus obtained.
A system for testing an X-ray tube comprising:
A system for testing an X-ray tube comprising:
Dependencies are inferred from the claim text.