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US 4,072,862 AGranted
Time-of-flight mass spectrometer
OwnerBoris A. Mamyrin, Valery I. Karataev +1inventors
InventorsBoris A. Mamyrin, Valery I. Karataev, Dmitry V. Shmikk
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Abstract
The invention relates to a nonmagnetic time-of-flight mass spectrometer whose analyzer chamber accommodates a pulsed ion source, an ion detector and an ion reflecting system disposed on one and the same ion-optical axis. The ion detector and the ion reflecting system are disposed on opposite sides of the ion source. The ion source comprises a source wherein all electrodes are transparent to the ions studied.
Claims17
A time-of-flight mass spectrometer, comprising:
- a vacuum analyzer chamber having an axis;
- means to maintain vacuum in said chamber;
- a pulsed ion source in said analyzer chamber;
- electrodes of said pulsed ion source which are transparent to the ions studied;
- an ion detector disposed in coaxial relationship with said ion source in said analyzer chamber;
- a drift space in said analyzer chamber disposed between said ion source and said ion detector;
- an ion reflecting system disposed in said analyzer chamber in coaxial relationship with said ion source on the side thereof facing away from said ion detector and a gap defined in said analyzer chamber between said reflecting system and said ion source.
4 more elements
A time-of-flight mass spectrometer comprising:
- a vacuum analyzer chamber having an axis;
- means for maintaining vacuum in said chamber to ensure a length of free flight of ion in said analyzer chamber considerably greater than the geometric size of the chamber itself;
- a pulsed ion source arranged in said chamber;
- electrodes of said ion source which are transparent to the ions being studied;
- means for forming ions being studied in the form of a stream between said electrodes of the ion source;
- an ion detector disposed in coaxial relationship with said ion source in said analyzer chamber;
- a drift sapce in said analyzer chamber disposed between said ion source and said ion detector;
- an ion reflecting system disposed in said analyzer chamber in coaxial relationship with said ion source on the side thereof facing away from said ion detector;
- a gap defined in said analyzer chamber between said ion reflecting system and said ion source;
- means for generating in said gap an ion reflecting electric field compensating for the energy spread of ions in the stream formed in said ion source.
7 more elements
Dependencies are inferred from the claim text.