Grain probe
AssigneeJaham Mfg. Co., Inc.
InventorJames T. Hamilton
Life of this patent
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AssigneeJaham Mfg. Co., Inc.
InventorJames T. Hamilton
Estimating the term…
A grain sampling probe device for insertion into grains comprises an elongated grain probe element which contains a plurality of openings extending along its length and a plurality of retaining brackets extending outwardly to define a passageway. Mounted integral to the grain probe is a hydraulic cylinder which is attached to a gate member, having a plurality of openings therein, which is slidably positioned within the passageway between the retaining brackets and the probe. The hydraulic cylinder selectively moves the gate member between an open position wherein the grain passes through the plurality of openings into the grain probe and a closed position wherein the openings are closed and the grain is sealed within the probe. A suction device is attached to the end of the probe to remove the collected grain after each sampling operation is completed.
A sampling device for insertion into a body of confined grain, including in combination:
A probe mechanism for use with a grain sampling device having a probe member mounting frame adapted to hold and position the probe mechanism in substantially a vertical position, control means for operating the probe member mounting frame in positioning the probe mechanism and suction means for removing the sampled grain from the probe mechanism, and probe mechanism including in combination:
Dependencies are inferred from the claim text.