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US 4,067,099 AGranted
Method of forming passivation film
AssigneeHitachi, Ltd.
InventorsSatoru Ito, Masataka Ota, Katsuro Sugawara
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Abstract
A method of forming a passivation film, wherein after circuit elements have been formed in the semiconductor substrate, a thin conductive film is formed on the entire surface of the substrate and then an insulating film is formed through electric discharge on the surface of the thin conductive film while the thin conductive film is kept at a constant potential.
Claims9
A method of forming a passivation film for a semiconductor device comprising the steps, in combination, of
- a. depositing a conductive film over an entire surface of a semiconductor substrate provided with semiconductor elements therein;
- b. maintaining said conductive film covering said entire surface at a fixed potential;
- and
- c. forming a passivation film on said conductive film covering said entire surface by means of discharge technique while said conductive film is being maintained at said constant potential.
1 more element
A method of fabricating a MOS IC, comprising the steps of
- a. forming a thermal oxide film (SiO.sub.2) on the surface of an N-type Si substrate;
- b. selectively removing said thermal oxide film to expose a part of said N-type Si substrate;
- c. forming a gate oxide film (SiO.sub.2) on the exposed surface of said substrate;
- d. forming a polycrystalline Si layer doped with impurity on said gate oxide film;
- e. etching away said polycrystalline Si layer and said gate oxide film, with that part of said polycrystalline Si layer which serves as a gate electrode being used as a mask;
- f. forming P+ layers for serving as a source and a drain by diffusing P-type impurity through the surface formed as a result of said etching;
- g. depositing PSG layer through CVD method on said thermal oxide film and said polycrystalline Si layer, except the portions where a source and a drain electrode are attached;
- h. forming a first Al film extending to said oxide film for provision of source and drain electrodes;
- i. covering said first Al film with a surface protection film selected from among a CVD SiO.sub.2 film, a PIQ resin film and CVD PSG film;
- j. selectively etching away said surface protection film so as to make exposed that part of said first Al film which serves as a bonding pad;
- k. forming through vapor-deposition a second conductive Al film over the entire portion of said surface protection film and the entire part of said Al film which has been exposed by etching;
- l. connecting said conductive Al film covering said entire portion of said surface protection film and said entire part of said first Al film with said substrate utilizing a conductor so as to maintain said second film and substrate at the same fixed potential;
- m. forming on said second conductive Al film a SiO.sub.2 film to be used as a passivation film through sputtering;
- n. selectively removing that part of said SiO.sub.2 film which lies on said bonding pad through photoetching;
- o. rendering the part of said second conductive A1 film adjacent said bonding pad to a non-conductive Al.sub.2 O.sub.3 film through an anode oxidation method;
- p. selectively removing the part of said Al.sub.2 O.sub.3 film on said bonding pad so as to make said bonding pad exposed;
- and
- q. attaching a gold bonding wire onto said bonding pad.
15 more elements
Dependencies are inferred from the claim text.