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US 4,066,895 AGranted
Scanning mass spectrometer having constant magnetic field
AssigneeShimadzu Seisakusho Ltd.
InventorMasaya Iwanaga
Life of this patent
Estimating the term…
Abstract
A mass spectrometer wherein the ion beam is deflected for scanning of a mass spectrum or selection of mass numbers, without changing the magnetic field strength and the ion-accelerating voltage. The means for deflecting the ion beam may be arranged between the ion source and the magnetic field or within the magnetic field or between the magnetic field and the ion detector.
Claims19
A mass spectrometer comprising an ion source for producing and ion beam of a sample;
- an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means being provided between said ion source of said magnetic field so that as said ion beam is deflected, the point or angle of incidence on said first end face at which said ion beam enters said magnetic field is changed so as to change the radius of curvature of the trajectory of the ion that enters said ion detecting means.
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising an electrostatic deflector disposed within said magnetic field so that as the electrostatic field strength of said deflector is changed, the radius of curvature of the trajectory of the ion that enters said ion detecting means is changed.
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- an analyzer including a constant magnetic field having a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means being arranged between said magnetic field and said ion detecting means so that as said ion beam is deflected, the radius of curvature of the trajectory of the ion that enters said ion detecting means changes.
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising a first electrostatic deflector arranged between said ion source and said first end face of said magnetic field to deflect said ion beam, a second electrostatic deflector arranged between said second end face of said magnetic field and said ion detecting means and means for operating said first and second electrostatic deflectors in ganged relation to each other.
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample;
- and an electrostatic lens arranged between said ion source and said first end face of said magnetic field to converge said ion beam from said ion source.
1 more element
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- and analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample;
- and an electrostatic lens arranged between said second end face of said magnetic field and said ion detecting means to converge said ion beam to be detected by said ion detecting means.
1 more element
A mass spectrometer comprising an ion source for producing an ion beam of a sample;
- an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field;
- means for detecting ions;
- and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said magnetic field being so arranged that an ion of a predetermined mass number included in said ion beam emerges from said second end face of said magnetic field to advance at a small angle with said second end face while the ions of smaller mass numbers included in said ion beam do not emerge from said second end face, and said detecting means is so arranged as to detect said ion of said predetermined mass number.
Dependencies are inferred from the claim text.