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US 4,066,882 AGranted
Digital stimulus generating and response measuring means
AssigneeGrumman Aerospace Corporation
InventorCharles M. Esposito
Life of this patent
Estimating the term…
Abstract
A high-speed, real-time automatic test system element that is compatible with most contemporary computers and will interface with units under test via a front-mounted coaxial patch panel and rear exiting cables to mate with common automatic test system interconnection schemes whereby a language driver callable with programming statements enables dynamic digital testing of modern integrated circuit cards and chassis at their normal clock rates and provides a digital reading of GO/NO-GO test evaluations.
Claims36
In a digital word generator, a control card module comprising:
- first means to receive input instructions and data bits from a source thereof, said means including a device to receive commands for a logic network to transmit command and flag signals to initiate and terminate a sequence of an operation scheduled by the source;
- second means connected to said first means and having decoder means for decoding computer instructions;
- read-write control means utilizing a plurality of serially related flip-flops, said read-write control means being operably connected and operatively connected to said decoder means;
- timing means operably connected to said first means, said timing means including an oscillator means driving a binary chain providing clock and timing sequence pulses and signals, respectively;
- a counter and control means for generating card select signals in accordance with signals from the read-write control means and timing means to which said counter and control means is connected;
- third means to be a buffer for data from the source and the decoder to deliver signals to an output connection;
- a fourth means to receive external signals and data processed by reason of the signals from the third means to interface externally generated signals and data with the control card module;
- and
- a data output means connected to said fourth means comprising a plurality of common clocked flip-flops that can be simultaneously loaded via a switching matrix to deliver data back to the source.
6 more elements
For a digital word generator having a means to sequence its functioning with a known frequency of operation and a plurality of memories for comparison of input to and output from a unit under test, a control means comprising:
- an input buffer means to accept data and instructions to programmably test a device;
- a timing means to generate a sequence of timing pulses, said timing means being operable by a command signal from said input buffer controlling a flag signal in terminating the sequence of timing pulses;
- instruction logic and decoder means connected to said input buffer and said timing means so as to provide a sequence of instructions during the sequence of timing pulses, said instructions being single word type;
- means to provide multi-word instructions, said means being operably and operatively related to said decoder means so as to provide write control, block-write control and block-read control instructions to control the memories;
- means to select specific memories operatively associated with said means to provide multi-word instructions;
- and
- means for storing data output from the memories.
4 more elements
For a digital word generator having a control card module and a memory card module, a timing generator module comprising:
- an input for data and instructions from the control card module;
- an oscillator circuit;
- a frequency counter operatively connected to the input and to the oscillator circuit;
- gate means connected to said frequency counter and the input, said gate means delivering clock pulses;
- pattern counter means connected to said input and said gate means;
- test length counter logic operatively connected to said gate means and said input to prescribe test length signals;
- a gate signal generator operatively connected to the input and the aforesaid test length counter logic to provide test gate signals on test execute instructions;
- a stimulus gate signal generator responsive to said gate signal generator, said stimulus gate signal generator being operably connected to said pattern counter means;
- a response gate signal generator operatively connected to the stimulus generator and operably connected to said pattern counter means;
- a strobe signal generator operatively connected to both said stimulus gate signal generator and said response gate signal generator;
- and
- output connections for said strobe signal generator and said pattern counter means for connection with the memory card module to control operation of same.
9 more elements
For use with a control card module and a timing generator card module in a digital word generator, a memory card module comprising:
- input means for data and instructions from said control card module as well as pattern counter, stimulus and response signals from said timing generator card module;
- memory means receiving said pattern counter signals and instructions;
- logic means responsive to said stimulus and response signals to strobe data to and from output drivers which are operative to deliver data to a unit under test and to a source for data and instructions via said control card;
- and
- means to control which of the memory means is to be operative, said means being operatively related to the logic means responsive to the response signals from the unit under test and inclusive of logic means to be operable per instructions from the control card module to gate data from the control card module via the memory means or data from the response means via the memory means.
2 more elements
A digital word generator for use with apparatus to digitally test electronic units, said digital word generator comprising:
- unit input and unit output means for connection with a unit under test, said means supplying data and instructions;
- control logic for decoding said input means data and instructions and providing data words, instructions, clock and time pulses, particular pin addresses at specific pin locations on individual slots and data output signals;
- a timing generator module connected to be commanded by said instructions of said control logic to strobe out said data of said control logic on precise pattern counts, stimulus signals, response signals and write signals;
- and
- a network of memory logic supplying the control logic data words to a unit under test and subsequently circulating data words from a unit under test to provide the data output signals for the control logic, said network including logic responsive to the timing generator module to strobe appropriate stimulus and responses of a unit under test with portions of memory devices as determined by pin location logic under precise pattern counts.
2 more elements
Dependencies are inferred from the claim text.