Method of fabricating high-gain transistors
AssigneeFairchild Camera and Instrument Corporation
InventorDavid O'Brien
Life of this patent
Estimating the term…
Loading patent…
AssigneeFairchild Camera and Instrument Corporation
InventorDavid O'Brien
Estimating the term…
A method of fabricating bipolar transistors with increased gain. A base region is formed adjacent the collector (or emitter) region of the transistor, and a portion of the base region is then removed by etching. The emitter (or collector) is then formed by diffusing dopant into the base region where the portion has been removed, with the base region separating the emitter and collector having reduced thickness due to the etching. Advantageously, the base region may be formed with a more heavily-doped region overlying a less heavily-doped region, with a part of the more heavily-doped region removed by etching, thereby providing a highly conductive path to the lower conductivity base region separating the emitter and collector regions. The process steps are compatible with conventional integrated-circuit fabrication processes.
The method of fabricating a bipolar transistor with improved gain in a semiconductor body comprising the steps of:
The method of forming a bipolar transistor in a semiconductor body comprising the steps of:
In the fabrication of bipolar transistors having emitter and collector regions of one conductivity type separated by a base region of opposite conductivity type, the method of increasing transistor gain by reducing base region conductivity and thickness, comprising the steps of forming a surface-oriented base region of said opposite conductivity type in said collector region of a semiconductor body, and removing a portion of said base region by etching, thereby reducing the thickness of said base region.
Dependencies are inferred from the claim text.