Inspection tool
AssigneeInternational Business Machines Corporation
InventorsJames Garman Belleson, Kendall Clark
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AssigneeInternational Business Machines Corporation
InventorsJames Garman Belleson, Kendall Clark
Estimating the term…
This patent discloses an improved inspection tool for rapidly inspecting miniature electronic conductor patterns, circuits and the like. The tool focuses a laser beam to a small laser spot that raster scans a large conductor pattern area on the workpiece being inspected. Reflected laser light from the workpiece impinges upon a light detector that generates electrical signals according to the presence or absence of conductor pattern material on the workpiece at the momentary X and Y coordinate of the scanning laser spot. The light detector signals are compared with a previously encoded data image of the correct circuit pattern for the X and Y coordinates of the scanning laser spot. When the signals and the data agree at all X and Y coordinate points the workpiece is accepted. If the signals and the data do not agree at one or more X and Y coordinate points a defect in the circuit pattern is indicated. A defect may indicate out-of-tolerance dimensions, possible electrical short circuits, and/or open circuits. The extent of a defect may be determined by adjacent X and Y coordinate points and suitable computer programming, while workpieces having extended or out-of-tolerance defects are rejected. The improved disclosed inspection tool includes apparatus for automatically compensating for variations in the workpieces, and to effect registration for the scanning laser spot.
An inspection tool comprising:
An inspection tool in accordance with claim 10 including lens means intermediate said grating and said second light detector means to focus the reflected portion of said laser light passing through said grating onto said second light detector means.
An inspection tool comprising:
An inspection tool comprising:
Dependencies are inferred from the claim text.