Dynamic linearization system for a radiation gauge
AssigneeSangamo Weston, Inc.
InventorJoseph A. Panarello
Life of this patent
Estimating the term…
Loading patent…
AssigneeSangamo Weston, Inc.
InventorJoseph A. Panarello
Estimating the term…
The disclosed linearization system and process converts a high resolution non-linear analog input signal, representative of the thickness of an object, into a high resolution linear analog output signal suitable for use in driving a variety of output devices. The system requires only a small amount of memory for storing pre-calculated non-linear correction coefficients. Prior art linearization systems typically require large memory configurations and/or powerful computers to develop the output signal from the non-linear input. The known systems do not take advantage of the high resolution inherent in the input signal. The disclosed system "channels" the input signal to separate circuit paths so that it may be used directly to; (1) locate an appropriate correction coefficient; (2) develop a correction term after an appropriate correction coefficient is located; and (3) develop a linearized signal having the same high resolution inherent in the input signal. Finally, the disclosed system processes the linearized signal to compensate for the possible errors introduced by radiation source noise. The processed linearized signal is the high resolution linear analog output signal which accurately represents the thickness of the object being gauged.
In a radiation gauge for measuring the thickness of objects, apparatus for converting a thickness representative non-linear analog signal to a thickness representative linear analog signal exhibiting the same degree of resolution inherent in said non-linear signal, comprising:
In a radiation gauge for measuring the thickness of objects, apparatus for converting a thickness representative non-linear analog signal to a thickness representative linear analog signal exhibiting the same degree of resolution inherent in said non-linear signal, comprising:
In a radiation gauge for measuring the thickness of objects a method for converting a thickness representative non-linear analog signal to a thickness representative linear analog signal exhibiting the same degree of resolution inherent in said non-linear signal, comprising the steps of:
Dependencies are inferred from the claim text.