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US 4,063,159 AGranted
Adjusting device for magnetic probes
AssigneeInstitut Dr. Friedrich Forster Prufgeratebau
InventorPeter Haberlein
Life of this patent
Estimating the term…
Abstract
A magnetic field probe is supported within a hollow base at one end by a resilient spring element and at its other end by a member adjustable to move the probe transversely of the axis defined by the probe ends. The spring element biases the probe in a direction transversely of the probe axis.
Claims8
A device for adjustably locating a magnetic field probe having two ends within a hollow base, comprising:
- first and second supporting bodies located within said base and affixed to said base at spaced points;
- a resilient element interconnecting one probe end with the first supporting body providing the probe body with at least two resilient degrees of freedom generally at right angles to the axis formed by the two probe ends;
- a socket and included spherical element interconnecting the second supporting body and the other probe end, and means for adjusting said socket and included spherical element as a unit transversely of the probe axis and relative to said second supporting body.
Dependencies are inferred from the claim text.