Reference voltage source for memory cells
AssigneeInternational Business Machines Corporation
InventorsRichard I. Spadavecchia, James R. Struk
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AssigneeInternational Business Machines Corporation
InventorsRichard I. Spadavecchia, James R. Struk
Estimating the term…
An improved random access word addressable monolithic memory having a storage cell for each binary bit of each binary word of storage capacity. The storage cells being arranged in groups. Each cell of any given group being adapted to store a binary bit corresponding to a given bit position of each word stored in said memory. Each cell of each group being connected via first and second bit lines to a sense amplifier. Each sense amplifier coupled to a reference voltage source. The magnitude of the reference voltage supplied by the reference voltage source bearing a substantially invariant mathematical relationship to first and second potentials manifested by said storage cells during a read mode. The storage cells may each be generally of the type disclosed and claimed in U.S. Pat. No. 3,423,737 entitled "Non Destructive Read Transistor Memory Cell" granted Jan. 21, 1969 to L. R. Harper and of common assignee with the instant application.
A reference voltage source for use in a random access monolithic memory having a plurality of data storage cells, each of said cells comprising a first transistor and a second transistor,
In a bi-polar random access monolithic memory having a plurality of memory cells for respectively storing electrical manifestations of a logical "1", of a logical "0", and
Dependencies are inferred from the claim text.