Microcircuit test device with multi-axes probe control

In combination for providing a controlled movement of a probe relative to a microcircuitry means in a particular plane defined by X and Z axes and along a Y axis substantially perpendicular to the particular plane,

• support means,
• a probe arm for carrying the probe, the probe arm being disposed in abutting relationship to the support means for movement relative to the support means in the particular plane,
• operable means extending between the support means and the probe arm and actuatable to provide a linear movement of the probe arm reltive to the support means along the X axis and to provide an arcuate movement of the probe arm relative to the support means along substantially the Z axis,
• control means adjustably coupled to the support means and the probe arm for providing on a controlled basis for the movement of the probe relative to the support means along the Y axis in accordance with the adjustment of the control means for providing the fulcrum for the arcuate movement of the probe arm relative to the support means along substantially the Z axis, and
• holding means disposed between the operable means and the control means and coupled to the support means and the probe arm for maintaining the probe arm in contiguous relationship to the support means and for providing the adjustments of the probe arm relative to the support means along the Y axis in accordance with the adjustment of the control means, the holding means being constructed to provide for movements of the probe arm relative to the support means along the X axis and along substantially the Z axis.

In combination for testing electrical microcircuitry,

• a probe arm,
• at least one probe carried by the probe arm,
• support means disposed in a planar relationship to the probe arm and in contiguous relationship to the probe arm along this place,
• operable means operatively coupled to the support means and the probe arm for coupling the support means and the probe arm to provide for a linear displacement of the probe arm relative to the support means in the planar relationship along a first axis and an arcuate displacement of the probe arm relative to the support means in the planar relationship along substantially a second axis transverse to the first axis in accordance with the operation of the operable means,
• holding means displaced from the operable means along the first axis for maintaining the support means and the probe arm contiguous to each other in the planar relationship, and
• control means displaced along the first axis from the holding means and further displaced along the first axis from the operable means and extending through the support means into operative relationship with the probe arm for providing on a controlled basis for the linear displacement of the probe arm relative to the support means along the first axis and for the arcuate displacement of the probe arm relative to the support means along substantially the second axis about the control means as a fulcrum in accordance with the operation of the operable means, the control means being adjustable to provide for an adjustment in the relative disposition of the support means and the probe arm along substantially an axis perpendicular to the planar relationship.

In combination for testing electrical microcircuitry,

• a probe arm movable in a particular plane,
• at least one probe carried by the probe arm for testing the electrical microcircuitry,
• support means disposed in contiguous relationship to the probe arm in the particular plane,
• operable means extending through the support means, in adjustable relationship to the support means, along substantially a first axis transverse to the particular plane, the operable means engaging the probe arm and being operable to provide for an arcuate displacement of the probe arm in the particular plane about a particular position on the support means as a fulcrum and to provide for a linear displacement of the probe arm relative to the support means in the particular plane along a second axis transverse to the arcuate movement,
• control means displaced substantially along the second axis from the operable means and extending through the support means into engagement with the probe arm in a relationship to provide for the arcuate displacement of the probe arm relative to the support means in the particular plane about the control means as a fulcrum and to provide for the linear displacement of the probe arm relative to the support means along the second axis, the control means being adjustable to vary the positioning between the probe arm and the support means along substantially the first axis, and
• holding means disposed between the operable means and the control means along the second axis and operatively coupled to the support means and the probe arm for maintaining the probe arm and the support means in the contiguous relationship and for providing for the adjustment of the probe arm relative to the support means along the first axis.

A device for testing printed circuitry comprising

• support means,
• electrical connection means mounted on said support means,
• a probe arm supported by said support means for movement in the particular plane relative to said support means,
• at least one test probe mounted on said probe arm having
• means thereon for contacting the printed circuitry for transmitting a current therethrough and
• conductor means interconnecting said electrical connection means and said circuitry contact means, and
• apparatus for selectively positioning said probe relative to said supporting means including
• first means for selectively moving said probe arm along substantially a first axis transverse to the printed circuitry being tested and
• second means for selectively moving said probe arm substantially universally in the particular plane substantially parallel to said printed circuitry,
• the first means including third means on the probe arm near one end of the probe arm and extending through the support means to the probe arm and constructed and disposed to provide an adjustment of the probe arm relative to the support means along substantially the first axis and further including fourth means extending through the support means to the probe arm and operable to provide a movement of the probe arm in the particular plane relative to the support means in accordance with such operation and further including fifth means operatively coupled to the support means and the probe arm at a position between the third means and the fourth means to bias the probe arm along substantially the first axis toward the support means, said conductor means including
• a pair of flexible conductive members arranged so as to be substantially perpendicular to said contacting means and
• said contacting means comprising
• a substantially flat blade having a point thereof for suitably contacting a circuit to be tested and
• means for electrically bonding said blade to said pair of conductive members and
• said conductor means including a pair of conductive pins each making electrical contact with an individual one of the flexible conductive members.