Apparatus for detecting registration marks on a target such as a semiconductor wafer
AssigneeInternational Business Machines Corporation
InventorsDonald E. Davis, Millard A. Habegger, Hannon S. Yourke
Life of this patent
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Abstract
A square shaped beam of charged particles is passed over a registration mark in the surface of a semiconductor wafer. A signal produced by a diode detector that is responsive to backscattered electrons will peak when the beam passes over each of the edges of the registration mark. The signal is differentiated; and the resultant signal is filtered and amplified to provide information regarding the position of the beam with respect to the wafer. If more than one diode detector is used, the signals are added just before or just after the differentiation.
Claims7
In apparatus for detecting the location of an electron beam with respect to registration marks on a wafer, said apparatus including:
- means for causing an electron beam to scan said registration marks, a plurality of detecting means each for detecting electrons scattered by said registration marks and for producing a first signal related to the time varying density of scattered electrons impinging on the detecting means, and analyzing means for analyzing data to provide an indication of said location;
- the improvement comprising:
- circuit means having an output and being responsive to said detecting means for producing a second signal at said output representing the time derivative of the sum of at least two of said first signals;
- said output being connected to said analyzing means to provide said second signal as data to said analyzing means.
In apparatus for detecting the location of an electron beam with respect to registration marks on a wafer, said apparatus including:
- means for causing an electron beam to scan said registration marks, detecting means for detecting electrons scattered by said registration marks and for producing a first signal related to the time varying density of scattered electrons impinging on the detecting means, and analyzing means for analyzing data to provide an indication of said location;
- the improvement comprising:
- differentiating means having an output and being responsive to said detecting means for producing a second signal at said output representing the time derivative of said first signal;
- said output being connected to said analyzing means to provide said second signal as data to said analyzing means.
Dependencies are inferred from the claim text.